The Trajectory Solar Monitor (TSM) metrology system from Nanometrics, which specialises in the manufacturing of advanced metrology systems, has been installed by a prominent solar PV manufacturer for the purpose of controlling Copper, Indium and Gallium (CIGS) films and monitoring of processes.
The TSM, which is well known for its ability to measure thickness of films, now has an added feature of photoluminescence scanning. This enhanced feature helps PV manufacturers to increase production and efficiency of cells. It also helps in the monitoring and controlling of the production processes involved.
The installation of the TSM was done as an addition to the existing reflectometry tools from Nanometrics, which are used for measurement of CIGS thickness, TCO and for a comprehensive control process in the manufacturing of PV cells. According to Lior Levin, who is the Director of Engineering in Nanometrics, the combination of data from TSM and the company’s NanoDiffract Software analysis engine will enable manufacturers to ehnace their yield by maintaining efficient controls over their production process and will also help customers to resolve roughness issues in CIGS solar cells. The thin film solar market requires latest metrology tools in order to ensure accurate and speedy feedbacks and thus improve cell efficiency.