Heater-integrated cantilever tips of atomic force microscope are broadly utilized to characterize coatings, paints, pharmaceuticals, and polymer films in optical devices and electronics. They have also been utilized in research laboratories to analyze basics of nanoscale heat flow, and to develop new concepts in data storage and nanolithography. However, nobody has so far utilized a heated nano-tip for performing electronic measurements.
This is an electrothermal cantilever from the University of Illinois, having nanometer-scale electrode tip integrated onto a microheater. (Credit: University of Illinois at Urbana-Champaign)
William King, who serves as a College of Engineering Bliss Professor at the University of Illinois at Urbana-Champaign’s Department of Mechanical Science and Engineering, stated that his team has designed a novel electro-thermal nanoprobe that is capable of controlling temperature and voltage independently at a nanoscale point contact. The nanoprobe is also capable of measuring the temperature-dependent voltage at the nanoscale point contact.
The electro-thermal nanoprobes are different when compared to thermal nanoprobes. They consist of three electrical directions to the cantilever tip, of which two paths conduct heating current and the third path enables the electrical measurement at the nanoscale. A diode junction integrated into the tip isolates the two electrical paths. The nanoprobes are compatible with any type of atomic force microscopes, as the cantilever has an intricate design.
The researchers have reported their research paper titled, ‘Thermoelectric Voltage at a Nanometer-Scale Heated Tip Point Contact’ in the ‘Nanotechnology’ journal. Patrick Fletcher, the paper’s first author, stated that the team’s objective is to carry out electro-thermal measurements on the nanoscale. The new electro-thermal nanoprobe is capable of measuring the nanoscale properties of materials, including ferroelectrics, thermoelectric and semiconductors.