Coxem is pleased to announce the introduction of the newest member of the EM-30 family of tabletop microscopes, the EM-30N. Building on the success of the original EM-30, the EM-30N features completely re-designed imaging electronics for improved resolution with less noise at high magnification and introduces our new Panorama mode for wide area scanning.
Delivered with both SE and BSE detectors, the EM-30N allows the operator to view either detector individually, side-by-side, or as a composite image for a better understanding of microstructure and chemistry. Low Vacuum mode allows the operator to image non-conductive samples without any special pre-treatment, while a built-in optical camera helps to manage multi-sample holders and simplify navigation using our “Macro-Micro-Nano” sample views.
Powered by NanoStation software, the EM-30N seamlessly integrates all SEM functions with EDS routines such as compositional particle analysis, and provides advanced image analysis tools like line profile analysis to more accurately determine particle size when working at the nanoscale. Automated features like near real-time automatic brightness/contrast simplify operation and help novice users achieve consistent results.
An optional STEM detector allows the EM-30N to utilize its 30 kV accelerating voltage capability to perform TEM analysis of samples on standard TEM grids, while the optional CoolStage allows analysis of samples from -25 °C to 50 °C.