Park Systems announce the launch of Park FX200, a state-of-the-art automated Atomic Force Microscope (AFM) designed for precision and ease of use tailored for 200 mm samples.
Image Credit: Park Systems
Whether you’re in an industrial R&D lab, a shared user facility, or a material analysis testing laboratory, their AFM system is engineered to meet your needs. With features like automated probe exchange, probe slots up to 16 slots, and region of interest (ROI) zooming, it streamlines your workflow and enhances productivity.
The system’s versatility is unmatched, accommodating wafers from 2-inch to 8-inch and multiple numbers of coupon-sized sample with a single vacuum chuck module. Performance is at the heart of the design, offering industry-leading low noise levels for the most accurate surface measurements and characterizations. Their powerful automation allows for seamless measurements across various modes, while the built-in safety features ensure reliability and longevity. Embrace the convenience, versatility, and performance that the AFM system brings to your research and analysis.
Key Features
Performance
- Industry-leading state-of-art AFM for surface measurement and characterization
- Powerful Automation
- Multiple samples on various modes
- Automated measurements and analysis
- Extremely low system noise (<0.5 Å)
- Various applications
Maintenance
- Environmental Sensing
- AFM Head crash prevention
Image Credit: Park Systems
Learn more about the FX200