Carl Zeiss introduces the LSM 700 / mat laser scanning microscope for materials research. It allows very precise, 3-dimensional imaging of surfaces. The combination of fluorescence and reflection techniques enables high-precision examination of semiconductors, metal, glass and polymers with high information content. The integrated detection of fluorescence signals on and in the materials provides additional information.
Photo of 3D surface topography of a solar collector captured with the LSM 700 laser scanning microscope from Carl Zeiss, EC Epiplan- Apochromat objective 50x/0.95; original stack: 80.1 µm x 80.1 µm x 8.2 µm.
The easy-to-use system permits precise capture of 3D topography or the determination of finest roughness, for example, without damaging the surface. The high reproducibility of the measured values, even of relatively soft surfaces such as polymers, is another outstanding feature of this microscope system.
Together with the Axio Scope, Axio Imager and Axio Observer microscopes from Carl Zeiss, the LSM 700 is an ideal system for materials research. Combining this system with the Axio Imager and Axio Observer, in particular, enables a wide variety of configurations. Therefore, various contrasting techniques from brightfield, darkfield and polarization-optical and standard DIC contrast to polarization and fluorescence contrast become possible.