About this webinar
In this webinar, we’ll delve into particle analysis of microscopy data and outline essential steps to ensure precise and insightful results. We’ll use Mountains® analysis software including recently released improvements during this demonstration.
What you’ll see in this webinar:
- Detecting particles in an SEM image using the Threshold method
- Defining thresholds
- Creating an overlay, monochrome or colored view
- Managing particle contour
- Labelling particles
- Using interactive results tables
- Exporting results
- Detecting particles in AFM topography with the Watershed method
- When and how to use the Watershed detection method
- Selecting relevant parameters to calculate
- Generating a dynamic image & combining it with topography to obtain stunning 3D views
- Applying color segmentation on an optical microscopy image (wear applications)
- Refining detected particles/filling in holes
- Using the “Results by class” table
- Analyzing results
About the Speaker
Mathieu Cognard, Product Manager for Scanning Probe microscopy & Light Microscopy Applications, Digital Surf
Mathieu graduated in 2013 with three Master's degrees in hydroinformatics project management, surface treatment and characterization. In 2016, he co-founded a start-up that uses self-assembled monolayers to enable nanoscale dry lubrication of metals and built up considerable technical expertise in surface characterization in the industrial field of metal working and tribology.
In 2018, he collaborated with professional cycling teams to optimize the performance of riders by focusing on optimizing the mechanical efficiency of the drivetrain through nanometric and tribological studies of surface treatments.
Since 2020, Mathieu has worked as a Product Manager for Scanning Probe Microscopy (SPM) applications for Digital Surf. He actively participates in the development of the MountainsSPIP® software platform by ensuring that it meets the growing challenges of researchers and industrialists in surface characterization.
Who should watch
The webinar is aimed at current users of Mountains® software, in particular (but not exclusively) the Particle Analysis module, anyone trying out the software and, more widely, at anyone analyzing data featuring particles, pores, grains and other image features (of any shape and size) that have boundaries. This data can be collected using profilometry or microscopy, in particular scanning probe microscopy (SPM) including atomic force microscopy (AFM), scanning electron microscopy (SEM), 3D profilometry, optical microscopy or spectroscopic techniques.