The Park NX20 Lite has several unique features that make it perfect for shared laboratories that manage a wide range of samples, failure analysis engineers working on wafers and researchers doing multi-variant experiments.
It is also one of the best-value large-sample AFMs currently available on the market due to its affordable pricing and robust feature set.
The Most Convenient Sample Measurements with MultiSample Scan
- Specially designed multi-sample chuck for the loading of up to 16 individual samples (optionally available)
- A fully motorized XY sample stage travels up to 150 mm x 150 mm
- Automated imaging of multiple samples in one pass
Accurate XY Scan by Crosstalk Elimination
- Two independent and closed-loop XY and Z flexure scanners
- Flat and orthogonal XY scan available with low residual bow
- Highly precise height measurements facilitated by NX electronic controller without any need for software processing
Best Tip Life, Resolution, and Sample Preservation by True Non-Contact™ Mode
- Rapid Z-servo speed allowing True Non-Contact™ Mode
- Minimum tip wear for extended high-quality and high-resolution imaging
Versatile Range of Modes and Options
- Extensive set of measurement modes and characterizations
- Advanced electrical measurements available for failure analysis (FA)
- Extended abilities with optional accessories and upgrades