The NANOS provides excellent SEM images at a low overall cost, and it comes with built-in energy dispersive spectroscopy (EDS) for quick elemental analysis. It is designed to be simple to set up, easy to operate, and straightforward to maintain.
Making SEM Accessible for Anyone, Everywhere
The NANOS is an all-inclusive and cost-effective tabletop scanning electron microscope (SEM). It is built with the latest technology to provide quick, high-quality SEM images and elemental analysis. Its sturdy and contemporary design makes it an ideal choice for research and development, educational purposes, and industrial applications.
Image Credit: Semplor
- Servicing: The NANOS design enables simple access for maintenance and upgrades, which could be completed at the user’s premises.
- Robust: With outstanding stability and a compact footprint, the architecture of the NANOS ensures it can be used in non-laboratory environments.
- Ease of use: In BASIC mode, the NANOS will produce outcomes in a short period of time, irrespective of experience. ADVANCED mode offers additional functionality for elaborate analysis.
- Design: The NANOS has a robust modern design and is engineered using the latest materials and components.
- Cost of ownership: The NANOS has been fabricated to keep the ownership cost lower than any benchtop SEM currently available.
- Configuration: The NANOS is delivered with BSD, SED, integrated EDS, and a Eucentric tilt stage.
Iconic Dutch Design
Designed and manufactured in the Netherlands, it prioritizes reliability, quality, and user-friendliness.
Image Credit: Semplor
Image Credit: Semplor
Image Credit: Semplor
Image Credit: Semplor
Image Credit: Semplor
Image Credit: Semplor
Key Features
- High-Performance SE and 4 Quad BSE Detectors
- 1–20 kV Acceleration voltage
- EDX ‒ Spot Analysis and Element Mapping
- Filament Performance Optimization
- Low Vacuum Capability
- Motorized XY Stage and Eucentric Tilt
- Easy to Use
- Low Service Costs
Specifications
Source: Semplor
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| SOFTWARE |
Optical |
Magnification range: 2 – 12x |
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SEM |
Magnification range: 50 - 200.000x |
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Resolution |
<10 nm |
| ILLUMINATION |
Optical |
Bright field |
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SEM |
Optimized thermionic source (tungsten) |
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Acceleration voltages |
Default: 1, 2, 5, 7, 10, 15 & 20 kV |
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Adjustable range between 1 & 20kV |
| DETECTOR |
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Secondary electron detector (SED) |
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Backscattered electron detector (BSD) – 4 quadrant |
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Energy Dispersive Spectroscopy detector (EDS) – integrated |
| DIGITAL IMAGE DETECTION |
Optical |
Color navigation camera |
| IMAGE FORMATS |
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JPEG, TIFF, PNG, BMP |
| USER INTERFACE |
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Communication, imaging and analysis use a single monitor with control via a wireless mouse & keyboard |
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Remote control (e.g. iPad) enabled |
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Basic & advanced modes |
| DATA STORAGE |
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Network, USB, workstation |
| SAMPLE STAGE |
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Eucentric tilt stage (-15 up to +40 ̊) |
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Computer-controlled motorized X, Y: 25 x 25 mm |
| SAMPLE SIZE |
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25 mm diameter pin stub |
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60 mm diameter round disk |
| EDS SPECIFICATIONS |
Detector type |
Silicon Drift Detector (SDD), thermo-electrically cooled |
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Detector active area |
30 mm2 |
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Energy resolution |
@ Mn Kα < 133 eV |
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Max. input count rate |
300,000 cps |
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Hardware integration |
Fully embedded |
| SOFTWARE |
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Integrated in NANOS user interface |
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EDS analysis and mapping |
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Export functions |
| SYSTEM SPECIFICATIONS |
Imaging module |
280 (w) x 630 (d) x 550 (h) |
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Weight |
60 kg |
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Pumps |
Turbo molecular pump with oil free membrane pre-vacuum pump |
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Vacuum modes |
High vacuum SEM (conventional SEM), and low vacuum 0.4 mbar (low vac SEM) |
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Controlled vacuum levels via the User Interface |
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Workstation |
Preconfigured All-in-One PC with a 27” monitor.
SEM imaging and EDS Analysis software installed |
Eucentric Stage
The NANOS features a unique Eucentric Stage, which is included as a standard component. The motorized XY movements of this stage can be easily controlled through the User Interface. When in SEM mode, tilting the specimen can be done manually by rotating the stage.
This Eucentric design ensures that the sample remains in focus without requiring adjustments to SEM settings in between. The User Interface also displays the precise tilt angle, allowing for sample tilting at angles of up to 55º.
Elemental Analysis
The NANOS is fitted with a completely integrated Energy Dispersive X-Ray (EDX) Silicon Drift Detector (SDD). Using the User Interface, operators have the option to choose EDX Point Analysis or activate Elemental Mapping.
Electron Detectors
The NANOS includes two detectors as standard features: a Secondary Electron Detector (SED) and a Back Scattered Electron Detector (BSD). The BSD is a 4-quadrant detector with independently controllable segments. These segments can be used in various combinations to extract compositional or topographical information from the sample. Additionally, they can create images that show surface details from different angles, giving a “shading effect”.
Image Credit: Semplor