High-Performance AFM for Nanoscale Imaging

The Nano-Observer II is a state-of-the-art atomic force microscope (AFM) that blends remarkable performance, adaptability, and ease of use. It provides a broad range of nanoscale imaging and characterization capabilities and is intended for beginner to expert users.

Video Credit: CSInstruments

Download the Brochure for More Information

Key Features

• AutoScan Software: Easier and Faster Automated Scanning
  • Three clicks will produce high-quality images
  • Electronic control and automated setup for easier operation
  • Detailed features and parameter configurations for more experienced users
• User-Friendly Design
  • Compact AFM head with pre-positioned tip system
  • Simple optical path and sample access
  • Effective pre-approach process via top and side views of tip/sample area
• Advanced Technology Integration
  • Low-noise USB controller (24-bit)
  • Low noise integrated lock-in features for improved phase detection, EFM/MFM/KFM, or piezoresponse force microscopy (PFM)
  • Advanced imaging modes include HD-KFM, ResiScope, and Soft Intermittent Contact (Soft-IC)
• High-Performance Scanning
  • High-resolution, low-noise scanning capabilities
  • Large-small area scans without changing the scan head
  • Consistent resolution across all scan sizes

Advanced Modes

ResiScope^™ III

• Electrical resistance is measured across 10 orders of magnitude (10² to 10¹² ohms)
• High sensitivity for in-depth examination of the electrical characteristics of materials
• Applications in advanced materials science, semiconductors, and photovoltaics

Sample: Polymer battery. Mode: Soft ResiScope. Scan size: 60 µm. Signal: Current from 2 pA to 3 µA. Image Credit: CSInstruments

HD-KFM^™ III (High Definition Kelvin Force Microscopy)

• Establishes new standards for mapping surface potential
• Increased spatial resolution and sensitivity
• Perfect for polymers, semiconductors, and 2D materials

Sample: Graphene. Mode: HD-KFM. Scan size: 20 µm. Image Credit: CSInstruments

Sample: Metallic structure embedded on epoxy. Mode: 1. Topography 2. HD-KFM dC/dZ. Scan size: Image Credit: CSInstruments

Soft IC Mode-The 3rd AFM Mode

• Combines the dynamic potential of resonant modes with the accuracy of contact AFM
• Suitable for soft and delicate materials
• Extensive electrical and mechanical measurements with little sample disruption
• Includes Soft Meka, Soft PFM, Soft ResiScope, and Soft SThM

Soft MEKA

• Soft IC mode extension for accurate mechanical property measurements
• High-resolution mapping of adhesion and stiffness
• Highly beneficial for soft or fragile samples

Soft PFM

• Combines Soft IC and PFM
• Concurrent electrical and mechanical measurements
• Excellent for thorough material analysis with little effect on the sample

Soft SThM Mode

• Soft IC mode extension for accurate thermal property measurements

Application Fields

• Photovoltaics
• Electrochemistry
• Corrosion Studies
• Nanomechanical Analysis
• Materials Science
• Semiconductor Research
• Polymer Studies
• Biological Samples
• 2D Materials Characterization

Download the brochure to learn more