Increasing AFMs' Capabilities with the Galaxy Dual Controller

Atomic force microscopy (AFM) systems such as the MultiMode, 5100, and 5500 are transformed into state-of-the-art tools for cutting-edge research with CSInstruments' Galaxy Dual Controller. Whether in semiconductor research, materials science, or nanotechnology, the Galaxy Dual Controller enhances functionality and performance, maximizing the AFM's potential.

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Unlock New Possibilities with Advanced Scanning Modes

The Galaxy Dual Controller allows users to upgrade the system with more complex, specialized scanning modes that provide deeper insights into material properties in addition to supporting typical AFM modes including STM, Contact, AC, Phase, MFM/EFM/PFM/LFM, and EC:

  • ResiScope: Enables high-resolution mapping of electrical resistance, providing exceptional sensitivity for analyzing the conductivity of various materials.
  • Soft-ResiScope: A variant of ResiScope designed for soft-touch measurements, ideal for examining delicate or fragile samples.
  • Soft Intermittent Contact Mode: Ideal for soft and sensitive materials and improves imaging capabilities by reducing sample damage during imaging.
  • High-Definition Kelvin Probe Force Microscopy (HD-KFM): Offers crucial insights into electrical properties by precisely measuring surface potential at the nanoscale

These modes help researchers perform more comprehensive studies on a variety of sample types by increasing measurement sensitivity, resolution, and precision.

Seamless Integration with Popular AFM Systems

The Galaxy Dual Controller integrates seamlessly with popular AFM systems, such as MultiMode, 5100, and 5500 AFMs, ensuring a smooth upgrade process. It enhances AFM capabilities, allowing users to leverage state-of-the-art advancements while continuing to work with familiar equipment.

Key Features

  • Advanced Imaging Modes: HD-KFM, ResiScope, Soft-ResiScope, and Soft Intermittent Contact modes
  • Compatible with Classic AFM Modes: STM, Contact, AC, Phase, MFM, EFM, PFM, LFM, and EC
  • User-Friendly Interface: The software provides automated and manual modes for all user levels, ensuring efficient and high-quality image acquisition

Specifications

  • High-Resolution Control: Exceptional accuracy using ultra-low noise electronics and a 24-bit drive architecture.
  • Integrated Lock-In: Operates up to 6 MHz, allowing for complex and advanced measurement capabilities.
  • USB Interface: Plug-and-play connectivity that is simple

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Upgrade the AFM

The Galaxy Dual Controller maximizes the AFM’s potential, delivering exceptional performance, adaptability, and user-friendliness for research. By incorporating advanced modes and enhanced control, it transforms the existing AFM into a cutting-edge system capable of high-resolution results across diverse applications.

Customer Feedback: Revolutionizing Research with the Galaxy Dual Controller

At the Institute of Advanced Energy at Kyoto University, our research focuses on cutting-edge carbon-based functional materials, particularly graphene nanoribbons (GNRs). These GNRs have shown remarkable catalytic performance in the chemical etching of Si, indicating their potential in semiconductor technology. Recently, we upgraded our MultiMode AFM with CSI’s Galaxy Dual Controller.

Hiroshi Sakaguchi, Professor, Institute of Advanced Energy, Kyoto University

This upgrade has breathed new life into our existing system, significantly expanding its functionality and capabilities. The option to integrate advanced modes, such as; HD-KFM, ResiScope, Soft-ResiScope, Soft Intermittent Contact Mode has notably improved our measurement precision and versatility. We now have the ability to characterize material properties with greater sensitivity, resolution, and accuracy across a wide range of samples,” added Sakaguchi.

Nano-Observer II: AFM for Nanoscale Imaging

Image Credit: CSInstruments

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Tapping Mode AFM Images of Graphene Nanoribbons on Si

Below are two high-resolution Tapping Mode AFM images of graphene nanoribbons on a silicon substrate captured using the upgraded system.

The two pictures were taken in different sizes:

1) Large-Scale Image: This image provides a general overview of the surface structure and distribution of the sample on the silicon substrate, displaying an island of graphene nanoribbon.

Nano-Observer II: AFM for Nanoscale Imaging

Image Credit: CSInstruments

2) Zoomed-In Image: This image provides a closer view of the tiny features of the graphene nanoribbons, highlighting their interactions with the silicon surface at the nanoscale.

Nano-Observer II: AFM for Nanoscale Imaging

Image Credit: CSInstruments

These pictures show the clarity and accuracy achieved with the Galaxy Dual Controller in conjunction with the MultiMode AFM, providing new insights into the structural characteristics of graphene nanoribbons.

Sakaguchi further added, “The initial results from our upgraded AFM have been very promising. The Galaxy Dual Controller has already made a substantial impact on our research processes, and we look forward to exploring its full potential. CSI’s support throughout this upgrade has been outstanding, showcasing their commitment to advancing AFM technology. We are excited about the future possibilities with the Galaxy Dual Controller and its role in continuing to enhance our research efforts.”

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