EDAX Octane Elite Ultra is a cutting-edge energy-dispersive X-ray spectroscopy (EDS) designed for high-precision compositional analysis in scanning electron microscopes (SEM).
Setting a new standard for EDS technology, the Octane Elite Ultra features a proprietary windowless 160 mm2 detector, delivering exceptional sensitivity across both light and heavy elements. With the ability to provide accurate analytical results at accelerating voltages up to 30 kV, it stands as the first windowless EDS detector optimized for everyday use.
This breakthrough in performance eliminates the need for a secondary EDS detector, ensuring that even the most demanding applications are met with accuracy and efficiency.
Benefits
- One detector for all your EDS applications – Delivers accuracy and versatility beyond expectations, eliminating the need for multiple EDS detectors.
- Unparalleled sensitivity for compositional mapping – Detects the lowest element concentrations with a signal-to-noise ratio (SNR) up to 25x better than conventional EDS detectors.
- Captures elemental and phase maps with unsurpassed spatial resolution – With a windowless sensor over 80 % larger, it allows rapid analysis of samples at the lowest accelerating voltages.
- Determines composition accurately over the broadest range of SEM conditions – Utilizes the power of an electron trap that operates at all accelerating voltages.
- Practical for multi-user environments – Exclusive design maximizes uptime, ensuring you can focus on what matters most: your research.
The Octane Elite Ultra features an EDS sensor more than three times larger than conventional large-area thin-window sensors. Its windowless design, combined with advanced processing electronics, enhances sensitivity by up to 25 times. This enables faster elemental mapping, real-time phase map collection, and the ability to capture maps with a field of view up to 25 times larger while maintaining the same SNR.
The Octane Elite Ultra features an EDS sensor that is over 80 % larger than any other windowless detector, delivering exceptional performance for even the most challenging applications. This allows users to operate the SEM at the lowest accelerating voltage or beam current, making it ideal for analyzing nanoparticles, beam-sensitive materials like hybrid organic-inorganic perovskites or tissue sections, low-boron steels, and ultra-thin dielectric layers in semiconductor devices.
The result is EDS analysis with spatial resolution approaching that of secondary or backscattered electron imaging.
Figure 1. Composite images of boron and cobalt elemental maps overlayed on the secondary electron image of a boron steel sample. a) Captured with the Octane Elite Ultra and b) another EDS detector; the superior sensitivity of the Octane Elite Ultra to light elements enables boron distribution to be mapped and determined quantitatively. Image Credit: Gatan, Inc.
Now, a windowless EDS detector can be the sole EDS detector on your SEM. The Octane Elite Ultra overcomes the limitations previously associated with windowless detectors, enabling faster element identification and precise quantitative analysis.
Equipped with an innovative electron trap, it prevents spectrum contamination from backscattered electrons with energies up to 30 keV, ensuring the highest accuracy across the broadest operating range. Paired with EDAX APEX™ EDS Advanced software (version 3.0 or later), the Octane Elite Ultra delivers reliable analytical results—making it the only EDS detector you’ll need.
With its proprietary sensor design, advanced system monitoring, and mechanical shutter, the Octane Elite Ultra actively safeguards the detector by continuously assessing the microscope’s operating conditions. It seamlessly transitions to a safe state when necessary, such as when vacuum conditions become unsuitable. Even in the event of a catastrophic SEM failure, the robust sensor maintains its performance, showing little to no degradation even after 48 hours of exposure to atmosphere while cooled.
Delivering precise quantitative analysis, meeting the most demanding analytical requirements, and ensuring long-term durability, the Octane Elite Ultra is the ultimate solution—even in multi-user environments.
Figure 2. EDS Spectrum and (inset) quantitative evaluation of vanadium oxide (V2O5) using the Octane Elite Ultra detector; the composition measured was within ±1 at. %. The SEM was operated at 25 kV, and the beam current was set to provide 20,000 cps. The spectrum was analyzed by standardless analysis using eZAF and carbon coat correction and a calculated Bremsstrahlung background using APEX EDS Advanced software version 3.0. Image Credit: Gatan, Inc.