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Virtual Environment Enables Scientists to Interpret Data from Dynamic AFMs

Purdue University is operating a virtual environment that enables scientists and engineers to interpret raw data collected with powerful instruments called dynamic atomic force microscopes.

17 Jul 2008

FEI Connectivity Solutions Reduce Wafers-to-Atoms Time From Days to Hours

FEI Company, a leading provider of atomic-scale imaging and analysis systems, today announced the Ultimate Throughput™ and Ultimate Imaging™ Connectivity Solutions. By accelerating and improving the quality o...

15 Jul 2008

First Nanostructures Ever Measured on Another Planet

For the first time ever, nanostructures have been measured on another planet. On July 9, the NASA Phoenix Mars Probe recorded images with nanometer resolution (one nanometer roughly corresponds to 0.00000004 inch) using its onboard Swiss-made atomic force microscope.

12 Jul 2008

Nanosurf Atomic Force Microscope Has Been Used on Mars by Phoenix Mars Lander

NASA's Phoenix Mars Lander has finally used the onboard atomic force microscope from Nanosurf. We show the first AFM image from Mars

11 Jul 2008

Building Components of Electronics Devices using Self-Organised NanoStructures

Confocal microscope image of a self-assembled monolayer of a polychlorotriphenyl methyl radical patterned on a quartz surface. This multifunctional molecule behaves as an electroactive switch with optical and magnetic re...

10 Jul 2008

One of the 100 Most Technologically Significant Innovations of the Year

WITec microscope technology has been selected as a winner of the prestigious 2008 R&D 100 Award. It honors the automated Confocal Raman and Atomic Force Microscope combination alpha500 as one of the 100 most technologically significant innovations of the year.

10 Jul 2008