LOT-Oriel Announces Availability of Ambios Q-Scope Scanning Probe Microscope

LOT-Oriel are proud to announce the availability of Ambios Q-Scope™ Scanning Probe Microscope - the industry's most cost-effective, complete, and turnkey SPM/AFM systems available

The Q-Scope™ family of Scanning Probe Microscope (SPM) features a totally modular design approach which delivers unmatched versatility and utility. Common to all models are the Q-Scan™ interchangeable scan head and our proprietary DSP control electronics. Standard Q-Scope models can then be configured using various sample stages, bases, software and scan accessories to tailor a specific instrument configuration to meet an individual customer's application requirements.

• Scan Range Choices - Interchangeable Q-Scan™ AFM scanning assemblies offer scan ranges from submicron to 200µm in X and Y and up to 17µm in Z.
• Fast Scan Rates - Scanning can be performed at rates as high as 20Hz, greatly reducing data acquisition times.
• High Precision Measurements - The Metrology option adds proprietary sensors to the scan module to accurately measure the precise position of the probe tip in X, Y, and Z axes. This capability is available on all models and improves positional precision of the acquired measurements to better than 1%.
• Sample Handling Flexibility - Manual or motorized sample translation stages are available on the Q-Scope. Sample sizes up to 240mm diameter can be accommodated.

For more information please go to http://www.lot-oriel.com/site/pages_uk_en/products/q-scope/q-scope.php or contact Heath Young on 01372 378822, e-mail [email protected].