May 4 2011
Supporting mass metrology as the preferred technique for in-line monitoring of product wafers, semiconductor metrology equipment company, Metryx, Limited, announced it will be sponsoring several key industry conferences as well as hosting a supplier seminar during the month of May.
The conferences include IEEE's International Interconnect Technology Conference (IITC), SEMI and IEEE's Advanced Semiconductor Manufacturing Conference (ASMC), and NIST's Frontiers of Characterization and Metrology for Nanoelectronics (FCNM).
"As a supplier of semiconductor metrology equipment, IITC, ASMC, and FCMN are three key technology conferences that are must-attend events," stated Dr. Adrian Kiermasz, President and CEO of Metryx. "The fact that we are involved as a key sponsor is a testament to how far mass metrology has come in the semiconductor manufacturing space, going from ground-breaking technology to being in volume production in four years. At IITC, we have also been invited to host a supplier seminar where three of our major European customers will share their experiences using mass metrology."
The IITC conference will take place at the International Congress Center in Dresden, from May 9 to 12, 2011. As a conference sponsor, Metryx will exhibit and host a supplier seminar at the Congress Hotel on May 10th. All conference attendees are welcome and can look forward to hearing about mass metrology directly from Metryx' customers. All attendees will also have the chance to win an Amazon Kindle e-book reader.
The ASMC conference, organized and hosted by SEMI, takes place at the Saratoga Hilton in Saratoga Springs, NY from May 16 to 18, 2011. As a premier provider of process monitoring and control equipment for product wafers, Metryx will be sponsoring Session 5 "Advanced Process Development and Control."
The FCMN conference has left the U.S. for the first time, and will take place at the MINATEC campus in Grenoble, France from May 23 to 26, 2011. As a Gold sponsor, Metryx will have high visibility at this conference, including a booth in the exhibitor area where attendees can learn about mass metrology.
"The next few weeks will provide a great platform for Metryx to continue to engage our key markets regarding the benefits associated with our technology, while providing an opportunity for semiconductor industry professionals to learn how mass metrology can benefit them," concluded Dr. Kiermasz.