Posted in | News | Nanoanalysis

Oxford Instruments Launch New Flagship Silicon Drift Detector for TEM

Oxford Instruments, a leading supplier of microanalysis systems, has launched a new detector for Transmission Electron Microscopes (TEM) that provides a sensitivity that is unsurpassed in Silicon Drift Detector technology. The X-MaxN 100TLE is the perfect solution for field emission and aberration corrected TEM users working at the frontiers of nanoscience.

The X-MaxN 100TLE exploits a new 100 mm2 sensor, a windowless configuration, and an innovative mechanical design that delivers ultra high solid angle. The detector delivers an unrivalled sensitivity for all elements, especially low energy X-rays.

For example, the effective solid angle is twelve times greater than a traditional 30 mm2 SDD for N Kα X-rays. This means that the user will be able to detect much lower concentration of elements, for example impurities and dopants at the nanoscale. Another benefit is the collection of more data before the beam degrades sensitive samples.

According to Oxford Instruments NanoAnalysis Marketing Director, Del Redfern, “This product is our flagship Silicon Drift Detector; it represents a leap forward in sensitivity and speed. During trials on an Ultra High Resolution TEM we were even able to produce an atomic column map in less than sixty seconds.”

Atomic column mapping of SrTiO3 acquired in less than 60 seconds by Oxford Instruments’ new X-MaxN 100TLE Silicon Drift Detector.

About Oxford Instruments NanoAnalysis

Oxford Instruments NanoAnalysis provides leading-edge tools that enable materials characterisation and sample manipulation at the nanometre scale. Used on electron microscopes and ion-beam systems, our tools are used for R&D across a wide range of academic and industrial applications including semiconductors, renewable energy, mining, metallurgy, and forensics. The division won a Queen’s Award for Enterprise and Innovation in April 2012.

About Oxford Instruments plc

Oxford Instruments designs, supplies and supports high-technology tools and systems with a focus on research and industrial applications. It provides solutions needed to advance fundamental physics research and its transfer into commercial nanotechnology applications. Innovation has been the driving force behind Oxford Instruments' growth and success for over 50 years, and its strategy is to effect the successful commercialisation of these ideas by bringing them to market in a timely and customer-focused fashion.

The first technology business to be spun out from Oxford University over fifty years ago, Oxford Instruments is now a global company with over 1900 staff worldwide and is listed on the FTSE250 index of the London Stock Exchange (OXIG).  Its objective is to be the leading provider of new generation tools and systems for the research and industrial sectors.

This involves the combination of core technologies in areas such as low temperature, high magnetic field and ultra high vacuum environments, Nuclear Magnetic Resonance, X-ray, electron and optical based metrology, and advanced growth, deposition and etching.

Oxford Instruments aims to pursue responsible development and deeper understanding of our world through science and technology. Its products, expertise, and ideas address global issues such as energy, environment, security and health.

Citations

Please use one of the following formats to cite this article in your essay, paper or report:

  • APA

    Oxford Instruments NanoAnalysis. (2019, February 11). Oxford Instruments Launch New Flagship Silicon Drift Detector for TEM. AZoNano. Retrieved on November 23, 2024 from https://www.azonano.com/news.aspx?newsID=28593.

  • MLA

    Oxford Instruments NanoAnalysis. "Oxford Instruments Launch New Flagship Silicon Drift Detector for TEM". AZoNano. 23 November 2024. <https://www.azonano.com/news.aspx?newsID=28593>.

  • Chicago

    Oxford Instruments NanoAnalysis. "Oxford Instruments Launch New Flagship Silicon Drift Detector for TEM". AZoNano. https://www.azonano.com/news.aspx?newsID=28593. (accessed November 23, 2024).

  • Harvard

    Oxford Instruments NanoAnalysis. 2019. Oxford Instruments Launch New Flagship Silicon Drift Detector for TEM. AZoNano, viewed 23 November 2024, https://www.azonano.com/news.aspx?newsID=28593.

Tell Us What You Think

Do you have a review, update or anything you would like to add to this news story?

Leave your feedback
Your comment type
Submit

While we only use edited and approved content for Azthena answers, it may on occasions provide incorrect responses. Please confirm any data provided with the related suppliers or authors. We do not provide medical advice, if you search for medical information you must always consult a medical professional before acting on any information provided.

Your questions, but not your email details will be shared with OpenAI and retained for 30 days in accordance with their privacy principles.

Please do not ask questions that use sensitive or confidential information.

Read the full Terms & Conditions.