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Characterizing Graphene with Atomic Force Microscopy and PeakForce Tapping

Atomic-force microscopy is a type of scanning probe microscopy with sub-Ångstrom resolution. It is able to gather data on the mechanical and electrical properties of materials and surfaces by ‘feeling’ or ‘touching’ the surface with a cantilevered mechanical probe [1] controlled by Piezoelectric components.

From Bruker Nano Surfaces and Metrology 7 Mar 2016

Using Transmission Geometry PXRD to Observe Solid State Reactions in Real Time

Dr. Thomas Hartmann and Dr. Sascha Correll, of STOE, are experts in the field of x-ray crystalography. AZoNano spoke to both of them about STOE's new piece of equipment; the INSITU HT2, how it can be used for transmission geometry experiments and why this is great news for solid state scientists.

From STOE 23 Feb 2016

Capturing Complete Quantitative AFM Nanoscale Property Data

Thomas Mueller, Director of Development Applications in the AFM business unit of Bruker’s Nano Surfaces Division, talks to AZoNano about Bruker's Dimension FastScan AFM and the benefits of using bandwidth for faster, real time atomic force microscopy research.

From Bruker Nano Surfaces and Metrology 9 Feb 2016

Analyzing Coated Glass Using Secondary Ion Mass Spectrometry

Development of glass coatings, that are able to reflect heat (infrared radiation) and allow visible light to pass through with little degradation of perceived clarity or color, is a direct result from the need for energy efficient buildings.

From Hiden Analytical 20 Jan 2016

Depth Profile Analysis Using Focused Ion Beam-Secondary Ion Mass Spectrometry

Strict regulatory and energy conservation requirements imposed on the construction and design of modern buildings in recent years have provided challenges for the glass industry. Thin material-coated float glass is a resulting technological advancement, produced to minimize emissivity.

From Hiden Analytical 19 Jan 2016

Using the Hiden EQS Energy Resolving Quadrupole Mass Spectrometer for Electron Impact Sputtered Neutral Mass Spectrometry

Hiden Analytical’s EQS is a high transmission quadrupole secondary ion mass spectrometry (SIMS) detector, featuring a 45° electrostatic, which allows simultaneous analysis of ion energy.

From Hiden Analytical 19 Jan 2016