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Endura Avenir Platform Increases 22nm Transistor Contacts

Applied Materials has recently added to the applications of its Applied Endura Avenir RF PVD platform to incorporate deposition of nickel-platinum (NiPt) alloys, to increase transistor contacts scaling to the 22nm technology node.

From Applied Materials Inc. 28 Mar 2011

Researchers Develop Tiny Detectors for Counting Individual Photons

Scientists have developed tiny detectors, referred as single-photon avalanche diodes (SPAD), for counting individual photons on a computer chip. These tiny devices generate a tick sound every time, when they detect a photon and hence, their performance is similar to mini Geiger counters.

22 Mar 2011

TTM to Exhibit Nano-Based Thermal Solutions at Semi Therm 2011

TTM, a provider of nanotechnology-based thermal management solutions for various system applications such as solar, battery, automotive, mobile, memory, and LED, announces that it will exhibit two innovative thermal solutions at the Semi Therm conference.

22 Mar 2011

Vendum to Develop Carbon Nanotube (CNT) and Cellulose-Based Power Source

El Segundo, California-based Vendum Batteries, a developer of battery technology, has recently unveiled a prototype research and development program.

19 Mar 2011

Vortex Nanodomains Enhance Memory Storage Capacity

A University of Michigan research team has discovered a method to enhance the performance of ferroelectric substances, which can create memory devices that store more memory than magnetic hard disks.

19 Mar 2011

Semiconductor Loadports Enhance Hygiene and Performance

California-based Crossing Automation has recently unveiled a range of adaptive standard mechanical interface (SMIF) loadport (LPT) systems at the tradeshow SEMICON in China.

19 Mar 2011

Nano-Scientists Record Ultra Fast Capture of Films

Researchers at Kiel University have published a paper in the March 9, 2011 edition of Nature that explains about laser’s impact on the electrical properties of solids. The team comprising Professor Michael Bauer...

16 Mar 2011

leading Japanese Semiconductor Manufacturer Selects Nanometrics Metrology System

Nanometrics Incorporated (Nasdaq: NANO), a leading provider of advanced process control metrology systems, today announced that a leading Japanese semiconductor company has selected its IMPULSE integrated metrology (IM) ...

9 Mar 2011

ASU's Research on Single Molecule Aids Development of Future Nanoscale Devices

In research appearing in a recent issue of the journal Nature Nanotechnology, Nongjian “NJ” Tao, a researcher at the Biodesign Institute at ASU, has demonstrated a clever way of controlling electrical conductance of a single molecule, by exploiting the molecule’s mechanical properties.

From Arizona State University 4 Mar 2011

Enhanced PLT Series of Precision Thin Film Resistors from Vishay

Vishay Intertechnology, Inc. today announced that it has enhanced its PLT series of precision low-TCR thin film resistors with improved tolerances down to 0.01%.

4 Mar 2011