Posted in | Nanotechnology in Semiconductors

Candela 7100 Series from KLA

This video provides an overview of Candela 7100 series from KLA. This series is designed for advanced defect inspection and classification of hard disk drive substrates and media and has enhanced sensitivity and classification capabilities.

The 7100 series helps in identifying and classifying submicron-level critical defects such as bumps, pits, particles, and buried defects, which aids in lowering inspection cost and maximizing yield.

Run Time - 4:48min

KLA Candela 7100 Series

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