Atomic Force Microscopes

Cantiliver Tip used to Map Magnetic Regions of Garnet Film.

The cantilever tip is coated with a magnetic strip and is being used to locate the the magnetic region of the garnet film.

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Asylum Research's Family of Atomic Force Microscopes (AFM)

A video clip from Asylum Research on their family of AFMs (atomic force microscopes). This briefly outlines their range of instruments and includes their latest addition the Cypher, which provides the most advanced AFM produced in the last decade.

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The Merger of Bruker and Veeco AFM and Optical Metrology Businesses

Frank Laukien, President and CEO of Bruker Corporation welcomes the Veeco Atomic Force Microscopy (AFM) and the Optical Industrial Metrology (OIM) instruments to the Bruker family.

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The OmegaScope AFM-Raman from AIST-NT

AIST-NT's Alexander Yalovenko shows us their OmegaScope AFM-Raman instrument. Based on their proven fast scanning Smart-SPM, The OmegaScope includes either single or 3 laser Raman capabilities that can access the sample from the top or side. The OmegaScope alsoe featured objectiove lenses up 100x magnification.

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CAMSIZER X2 - RETSCH TECHNOLOGY - Short Introduction

The quality control of fine powders can be substantially improved with the new CAMSIZER X2: More precise and faster analysis of particle size and particle shape helps to improve the product quality, reduce rejects and save labor costs, energy and raw materials.

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Typical Topographic Images of DPPC/DOPC Lipid bilayer

This video shows the typical topographic images of DPPC/DOPC (dipalmitoylphosphatidylcholine/dioleoylphosphatidylcholine) supported lipid bilayers.

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Bruker Nano Surfaces Customer Care Centre - Interview with John L. Trahan

John L. Trahan, VP of Global Technical Support for Bruker Nano Surfaces talks to AZo.TV about the new European Customer Care Center in Karlsruhe, Germany.

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CAMSIZER X2 - Product Video

The quality control of fine powders can be substantially improved with the new CAMSIZER X2: More precise and faster analysis of particle size and particle shape helps to improve the product quality, reduce rejects and save labor costs, energy and raw materials.

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Advances and Applications in Electrochemical AFM

This video features a presentation by Bruker that discusses the recent advances and applications of the electrochemical atomic force microscopy (AFM) techniques.

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Webinar: Piezo-response force microscopy (PFM)

In this webinar, Dr. Patrick Frederix presents Piezo Force Microscopy and describes its implementation on Nanosurf instruments.

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Time-Lapse AFM Images of DPPC/DOPC Lipid Bilayers

This video shows the time-lapse AFM (atomic force microscopy) images of DOPC/DPPC (dioleoylphosphatidylcholine/dipalmitoylphosphatidylcholine) supported planar lipid bilayers.

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Demonstration: Imaging 2D Materials with the FlexAFM

Dr. Edward Nelson, Technical Support specialist, conducts a demonstration during which he highlights the capabilities of the FlexAFM and its ease of use.

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Quantum Dot Fabrication using Tip of an AFM

Fabrication of a quantum dot by writing oxide lines on a semiconductor heterostructure, using the tip of an atomic force microscope.

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Adaptive Optics in Laser Welding & Cutting – Fast Piezo Mirror | PI

Piezo ceramic actuators combine rapid response with high resolution and high force generation, ideal prerequisites to drive highly-dynamic deformable mirrors.

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The World's Fastest AFM - The Bruker Dimension Fastscan

The Dimension FastScan™ Atomic Force Microscope (AFM) from Bruker is currently the world's fastest AFM.

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AFM Probes from Bruker

This video shows how Bruker maximizes AFM performance with the industry's best probes. Bruker is the performance leader in AFM probes and it designs AFM and probes with optimal performance in mind.

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Motorized Precision Microscope Stage XY Direct-Drive Motor for Microscopy

XY Linear Stages with direct-drive piezo motors provide high resolution and stability.

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Microtrac MRB Company Video - Solutions in Particle Sizing

Microtrac MRB's core competence is to combine innovative particle characterization technology with maximum operating convenience.

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Atomic Force Microscopy in Imaging Biological Systems

Near field optical microscopy using AFM in combination with laser to produce high resolution images at the nanoscale on samples ranging from quantum dots to biological samples. The focus is on imaging various biological systems.

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CAMSIZER P4 - RETSCH TECHNOLOGY - Short Introduction

The CAMSIZER P4 particle analyzer has been developed to comprehensively characterize dry, free flowing bulk materials.

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Fluorescence and Atomic Force Microscopy

This video is a brief overview of what Jordan Gerton's lab at the University of Utah researches. Included is a brief description of fluorescence and atomic force microscopy and the future uses of it

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Bruker's PeakForce Tapping QNM for Mapping Nanomechanical Properties

This video demonstrates how Bruker's PeakForce QNM uses the PeakForce Tapping technology to map and distinguish between nanomechanical properties such as modulus, dissipation, deformation and adhesion, while simultaneously imaging sample topography at atomic scale resolution.

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Recent Advances in AFM-Based Nanoscale Thermal Analysis

This exclusive video features a presentation about the latest advances in atomic force microscopy (AFM)-based nanoscale thermal analysis.

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Recent Advances in AFM for Microbiological Research

This presentation discusses the latest advancements in Bruker’s atomic force microscopy (AFM) modes, techniques and technology for novel microbiological research.

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Introduction of Dimension FastScan at Nanoscale 2012

In this video Samuel Lesko, European Applications Lab Manager, demonstrates the unmatched speed and versatility of Dimension FastScan atomic force microscope from Bruker.

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Bruker Nano Surfaces European Applications Centre - Interview with Klaus Pross

Klaus Pross, Sales manager for Germany, Austria and Switzerland at Bruker Nano Surfaces talks to AZo.TV about the new European Application Center in Karlsruhe.

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Materials Characterization with the NanoIR from Analsys Instruments

Curt Marcott from Light Light Solutions tells us how the NanoIR from Anasys Instruments has opened up new possibilities in materials characterization. Combining AFM and IR spectroscopy provides spatial resolution an order of magnitude better than conventional IR, which enables researchers to do such things as examine nanoparticles in a matrix, or analyze for compositions differences across in interface.

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High Speed AFM Performance on Three Qualification Samples

This video shows the high speed performance of the atomic force microscope (AFM) from Bruker on the three qualification samples. The tip-check, Celgard and calibration grating are the three standard samples.

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Fast Scanning AFM Imaging of DNA on Mica Using the Cypher AFM from Asylum Research

In this video a loosely bound DNA sample on mica is imaged using the Cypher AFM from Asylum Research. The interesting feature of this video is that the DNA strand appears to break during the scan. However, upon closer examination, what really happens is that the DNA actually remains undamaged and the apparent breaks are a consequence of taking still images of a dynamic process.

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Characterization of Stem Cell Flattening using Dimension FastScan AFM from Bruker

This video shows the characterization of flattening of stem cell sing Dimension FastScan AFM and FastScan-Bio Cantilevers from Bruker.

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Electrospinning Nanofibres using a Single Nozzle via Inovenso

Watch the electrospinning process in action producing nanofibres, feeding nozzle, polymer solution droplet, taylor cone formation, spinning jet, nanofibre formation. Process parameters: 19kV, 120mm, 2,8ml/h polymer feeding rate. This shows high throughput nanofibre production with Inovenso electrospinning units. https://www.johnmorrisgroup.com/AU/Va...

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Determination of Modulus of Elasticity for Soft Materials using AFM from Bruker

This webinar investigates the advantages and usage of AFM on studying the mechanics of soft materials from Bruker.

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High Performance SuperResolution Microscopes with PI Nanopositioning Stages - Witec

Find out how WITec - a manufacturer of high-resolution near-field atomic force microscopes and confocal Raman systems - can provide superior instruments with nano-positioning technology from PI - since the company started 21 years ago!

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Scan of Polysilicon with Dimension FastScan

This video shows a 2 µm x 2 µm, 512 pixel x 512 pixel image of Polysilicon obtained using Bruker’s Dimension FastScan atomic force microscope (AFM).

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AZo2Bruker - Grand Opening of Bruker Nano Surfaces Customer Facilities

AZo.TV visited the Bruker Nano Surfaces headquarters in Karlsruhe, Germany, for the grand opening of their new European Customer Care Centre and Application Centre.

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ScanAsyst AFM Imaging Mode from Bruker AXS

This video shows the ScanAsyst atomic force microscopy (AFM) imaging mode from Bruker AXS.

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MRS Fall Meeting 2012, Boston - Exhibitor Interviews and Product Demos with AZoTV

This playlist contains all of AZoTV's interviews with exhibitors at the MRS Fall Meeting 2012 at the Hynes Convention Center in Boston, Massachusetts. These videos give a fantastic overview of the impressive array of equipment on show at the exhibit from some of the top names in materials science.

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Scan of Celgard with Dimension FastScan

This video demonstrates a 1 µm, 23 Hz, scan of freshly prepared Celgard with perpendicular mesh orientation using Bruker’s Dimension FastScan atomic force microscope (AFM).

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Dynamics of CM15 Antimicrobial Activity on Outer Membrane of E. coli Cells

This video shows the CM15 antimicrobial activity on the nanoscale structure of E. coli bacterial cell membrane.

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Use of AIST-NT AFM High-Speed Scanning of a Celgard Sample (15Hz)

The use of high-speed scanning on a Celgard sample (15Hz).

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ScanAsyst Atomic Force Microscopy Imaging Mode from Bruker

This video shows the ScanAsyst atomic force microscopy (AFM) imaging mode with automatic image optimization technology for use in Bruker’s premium AFM microscopes.

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The NHT2 Nanoindentation Tester and AFM from CSM Instruments

Nicholas Randall from CSM Instruments shows us the NHT2 Nanoindentation tester which combines a nanoindenter and AFM in one compact, affordable desktop unit. The unit has been re-designed and now features liquid compatibility, a wider load range and multi sample capability. It also does away with the need for an optical microscope by using two video cameras, proving a side view and a top view.

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Fast Scanning Celgard in Tapping Mode Using the Cypher AFM from Asylum Research

In this demonstration the Cypher AFM from Asylum Research scans a sample of Celgard which is used as a battery separator. This material is best scanned in tapping mode due to its fibrous/porous, irregular surface.

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B&W Tek’s Explains the Benefits of Handheld Raman Spectroscopy

This video shows the advantages of using handheld Raman spectroscopy and how it solves problems in real-life applications. B&W Tek’s Katherine Bakeev explains the benefits of handheld Raman spectrometers in this educational video.

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The Dimension Fastscan from Bruker - The Fastest AFM on the Market

John Thornton from Bruker takes us for a tour of the Dimension Fastscan atomic force microscope AFM.

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Webinar: AFM in materials and life science

In this webinar, Dr. Ed Nelson discusses a broad range of AFM applications in life science and materials research.

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Studying Graphene with Raman Spectrometers - The Benefits

Professor Robert J Young of the National Graphene Institute and School of Materials, University of Manchester discusses using Raman Spectroscopy to study graphene.

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Particle X-Plorer Software Module - RETSCH TECHNOLOGY

The RETSCH TECHNOLOGY software module Particle X-Plorer is used in both our particle analysis systems CAMSIZER P4 and CAMSIZER X2 and offers the user a wealth of features and possibilities to obtain in-depth knowledge of his sample.

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CoAxial Electrospinning Nozzle for Nanofiber Production

Co-axial electrospinning nozzle to obtain; Hollow, Bi-component, Co-axial nanofibers from polymer solutions. Easy to install on your system, repeatable results on nanofiber production process, compact design, easy cleaning and maintenance. Brass and Stainless Steel options available. Contact with INOVENSO LTD Co. www.inovenso.com for deatils.

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On-Demand Videos: Atomic Force Microscopy (AFM) Master Class

The essential short course for researchers using atomic force microscopy (AFM).

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AFM-Raman Solutions from Bruker Nano

This video features Bruker’s unique IRIS TERS probes. The features of these probes are high resolution AFM, High performance Raman spectroscopy and it takes to the ultimate step to TERS.

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PilotLine Electrospinning Machine for Industrial Nanofiber Production

Nanospinner PilotLine Semi Industrial Electrospinning Machine is designed for precise product development processes with nanofiber membranes. The model is specifically suited to universities and industrial R&D departments of companies engaged in electrospinning over long time intervals requiring in-situ parameter optimization. With the programmable touch screen control panel it is so easy to re-call the previous recipes and produce new samples within all same parameters thus will provide easy to compare results and creates logical steps for product development. This flexible, programmable, recipe re-call enabled system has long-term electrospinning capability and is supported by unique features. www.inovenso.com Bottom-Up spinning Up to 30 concurrently feeding nozzles 500mm wide nanofiber coating Programmable touch screen control panel Continuous roll to roll substrate winding collector system Adjustable horizontal movement between 30-80mm and 5-50mm/sec Automatic adjustable spinning distance between 30-230mm. Nozzle to collector. 0,01-5gr/metersquare thick nanofiber membrane production capacity.

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Introduction of Innova IRIS at Nanoscale 2012 from Bruker

This video Thomas Mueller of Bruker Nano Surfaces highlights the features and benefits of Bruker's Innova-IRIS AFM-Raman solution.

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The Veeco Bioscope Catalyst - AFM with Inverted Optical Microscope

Mickael Febvre from Veeco takes us for a tour of the Bioscope Catalyst, which is an atomic force microscope with an inverted optical microscope. The system is suited to biological applications.

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Sound, Vision and Nanoscience

Scientists at the University of Bristol are turning to nature in their attempts to further their research into Nano-science and at University of Bath they're applying Nano-science to investigate new lighting technology.

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Dimension FastScan with ScanAsyst AFM Imaging Mode

This video from Bruker illustrates the working principle of the Dimension FastScan atomic force microscope (AFM) with ScanAsyst and unattended high-speed imaging on a variety of samples.

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Sample Scanning with the TT-AFM from AFM Workshop

This video (Part 3 of 3) provides a demonstration of the TT-AFM from AFM Workshop. It shows the entire process from loading a sample to obtaining results.

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Overview of Nanosurf's NaioAFM System

This video provides an overview of the features and handling of the NaioAFM system. Nanosurf's NaioAFM is a compact atomic force microscope developed for nanoeducation and small sample measurements. The NaioAFM is easy-to use, has a small footprint, and comes with a price tag that fits all budgets.

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MERLIN Scanning Electron Microscope by Carl Zeiss

This video from Carl Zeiss shows the AFM system, which is ready in a matter of minutes to provide atomic surface topographical resolution in 3D.

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The Multiview AFM/Raman System from Nanonics Imaging

David Lewis from Nanonics Imaging Ltd shows us their Multiview Series of AFM/Raman systems that can be supplied with Renishaw or Horiba Raman systems. Nanonics can also supply the Multiview systems as upgrades to existing Raman systems of total systems.

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The Phoenix Lander AFM Aquires First Image of Martian Dust

This animation is a scientific illustration of the operation of NASA's Phoenix Mars Lander's Atomic Force Microscope, or AFM. The AFM is part of Phoenix's Microscopy, Electrochemistry, and Conductivity Analyzer, or MECA.

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A NanoLeap into the Atomic Force Microscope

This video engages students with a demonstration of how an Atomic Force Microscope (AFM) is used to image the surface of a DVD.

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Atomic Force Microscopy and Its Working Principle from Bruker

In this webinar Dr.Chunzeng Li from Bruker explains how AFM works and also shows some of the many things it can do.

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The Flamingo High Resolution Microscopy Project

Professor Dr. Jan Huisken, Director of Medical Engineering at Morgridge Institute for Research, explains technology and the philosophy of the Flamingo project and how the cooperation with Physik Instrumente as provider of the precision positioning and motion systems in the microscope has come about.

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The Bruker Innova-IRIS AFM-Raman System

Stefan Kaemmer from Bruker gave a tour of their new Innova-Iris syste AFM-Raman System.

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Ultrahigh Resolution Imaging and Mechanical Mapping of Bacteriorhodopsin

This video describes the Nano Letters paper on the high speed atomic force miscroscopy (AFM) imaging and mechanical mapping of purple-membrane (bacteriorhodopsin) with Bruker’s Dimension FastScan and ultra low amplitude Peak Force Tapping.

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Scan of Diffraction Grating with Dimension FastScan

This video illustrates a 180 nm, 30 µm, 11 Hz, scan of diffraction grating taken with Bruker’s Dimension FastScan atomic force microscope (AFM).

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Shuttle and Find for Life Sciences by Carl Zeiss

Are you looking for a way to effectively combine imaging and analytical methods of light and electron microscopy?

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Components of the TT-AFM from AFM Workshop

This video (Part 1 of 3) shows all the main components of the TT-AFM from AFM Workshop. These include the E-box, video microscope and AFM stage.

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Peak Force Tapping Mode on the Multimode 8 AFM from Bruker Nano Surfaces

Chris Gregory, Sales Engineer from Bruker Nano Surfaces, gives a demo of Peak Force Tapping AFM Imaging mode and the ScanAsyst and ScanAsyst HR modes, using the Multimode 8 AFM From Bruker.

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Molecular Dynamics Simulation of an Atomic Force Microscope

A Molecular Dynamics Simulation of an Atomic Force Microscope by Ivan K. Schuller from UCSD

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The Veeco Dimension Icon Atomic Force Microscope

Mickael Febvre shows us the Veeco Dimension Icon high performance atomic force microscope (AFM). With large sample stage it can perform measurements in a variety of atmospheres.

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Use of AIST-NT AFM High-Speed Scanning of a Celgard Sample (10Hz)

High-speed scanning of a Celgard sample.

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Demonstration of the Dimension FastScan AFM from Bruker Nano Surfaces

Hartmut Statler from Bruker Nano Surfaces demonstrates the capabilities of the Dimension FastScan, with image refresh rates up to one frame per second or more.

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RETSCH TECHNOLOGY - Motorized Guidance Sheet for CAMSIZER P4

The patented Motorized Guidance Sheet for the RETSCH TECHNOLOGY CAMSIZER P4 was exclusively designed for special applications in order to preferentially orient the particles.

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Particle Analysis of Spray Dried Powders - CAMSIZER X2

Particle size analysis of spray dried powders in the RETSCH TECHNOLOGY CAMSIZER X2.

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The Software User Interface of the TT-AFM form AFM Workshop

This video (Part 2 of 3) shows the software user interface of the TT-AFM from AFM Workshop.

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Opterra Multipoint Scanning Confocal Microscope from Bruker for Biology Applications

This video shows Opterra Multipoint Scanning Confocal Microscope from Bruker. This system integrates confocal imaging with photoactivation, allowing high-speed imaging of live cell and small organism preparations.

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Webinar: Scanning Microwave Microscopy (SMM)

In this webinar, Dr. Denis Vasyukov shows how Scanning Microwave Microscopy works theoretically, and how this mode of measurement performs on Nanosurf instrumentation.

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Enhancement of Traditional Electron Microscopy Applications with AFM from Bruker

This Bruker video illustrates the latest advances in electron microscopic techniques that provide a highly productive non-imaging workflow with AFM.

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Bruker Nano Surfaces Customer Care Centre - Interview with Venkata Reddy Mukku

Venkata Reddy Mukku, Service Manager for Europe, the Middle East and Africa at Bruker Nano Surfaces, talks to AZo.TV about the new European Customer Care Center in Karlsruhe.

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AUTOSAMPLER for CAMSIZER P4 - RETSCH TECHNOLOGY - Short Introduction

Whenever varying sample materials are to be analyzed or repeat measurements need to be carried out, the AutoSampler adapts perfectly to the defined measuring routine.

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Innova-IRIS AFM-Raman System from Bruker Nano Surfaces

The Innova-IRIS system integrates a high-stability AFM platform with a top-of-the-line Raman spectrometer, allowing chemical or crystallographic information to be correlated with AFM topography.

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Particle Analysis with the CAMSIZER® P4 – Retsch Technology

The CAMSIZER P4 particle analyzer has been developed to comprehensively characterize dry, free flowing bulk materials. Whereas traditional sieve analysis, for example, can only determine the approximate particle size, the CAMSIZER P4 simultaneously measures both particle size and shape – with much more detail and at a higher resolution.

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The First Ever Global Study on The AFM Market Conducted with AFM Users

In this exclusive interview with Barbara Foster from the Microscopy and Imaging Place or The MIP conducted at Pttcon 2009, we learn about a new market report. It is in fact the first ever global report on the AFM market place using feedback from AFM users themselves.

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Webinar: Comparison between AM KPFM and FM KPFM

In this webinar, Dr. Denis Vasyukov will present details of different implementations of KPFM imaging and their applications.

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Science and Technology United with Art

Micro Art: Science and Technology united with art. What you are seeing here is not CGI or Photoshop... These are real, beautiful images of things as they appear under powerful electron and atomic force microscopes.

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Bruker AFM Probes

This video presentation discusses about the powerful diversity of the AFM (atomic force microscopy) probe from Bruker Nano Surfaces.

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Bruker Nano Surfaces European Applications Centre - Interview with Jim Flach

Jim Flach, Director of European Sales at Bruker Nano Surfaces, talks to AZo.TV about the new European Applications Center in Karlsruhe.

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PeakForce Tapping Mode in AFM instrumentation on DNA from Bruker

This video from Bruker shows the recent advances in AFM instrumentation on DNA. The visualization of helical characteristics of DNA is now possible with Bruker's PeakForce Tapping mode in AFM.

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Pittcon 2012 - The Largest Annual Laboratory Science Event in the World

Pittcon is the world's largest annual conference for laboratory science. The 2012 event will attract over 950 equipment manufacturers, distributors and service providers from 30 countries. The technical program will also include over 2000 sessions covering over 60 topics.

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Time Series of CM15 Antimicrobial Activity on Live E. coli Cells

This video shows the time series of CM15 antimicrobial activity on live E. coli cells.

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BioScope Catalyst AFM with Inverted Optical Microscope for Life Sciences Applications from Bruker

Hartmut Statler from Bruker shows us the BioScope™ Catalyst™ AFM. The Catalyst is designed to be integrated with a wide range of inverted optical microscopes, making it perfect for life science applications.

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DynaPro Plate Reader III – Automated Biopharmaceutical and Nanoparticle Characterization

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Ultrasonic Transducers: Using Industrial Ultrasound for Distance Control, Structural Monitoring and Object Recognition – Advanced Piezoelectric Design

Ultrasound can be used for industrial inspection and automation - the technology is similar to the one know from medical ultrasonic imaging.

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Fast Scanning - Calcite Reconstruction Viewed by Cypher AFM

This interesting video shows the behaviour of freshly cleaved calcite which reconstructs upon exposure to humid air. The action was captured with a Cypher AFM from Asylum Research that rapidly scans the surface of the sample.

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Capturing Biological Dynamics with FastScan Bio from Bruker

This video shows the application of Dimension FastScan Bio™ Atomic Force Microscope (AFM) from Bruker Nano.

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Introduction to Carbon Nanotubes and Atomic Force Microscopes (AFM)

The video provides an excellent introduction to Carbon Nanotubes including an outline of how an AFM probe operates.

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An Interview with Dr Mark Munch - Leading the Way for the AFM Industry

Dr Mark Munch, President of Bruker Nano Surfaces, talks to Will Soutter about the challenges and opportunities for AFM research at the Seeing at the Nanoscale event in Bristol.

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Webinar: Nanosurf Python API

In this webinar, Nanosurf introduces the Nanosurf Python API and learns how to control Nanosurf instruments with it.

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Polarization Control Technology and NanoIR from Anasys Instruments

Curt Marcott from Light Light Solutions tells us about recently introduced polarization control technology that is available on the nanoIR system from Anasys Instruments. While nanoIR technology, a combination if IR spectroscopy and AFM extends the limits of IR spectroscopy, polarization control technology provides information about molecular orientation.

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Mountains Map 6 Software for Texture and Roughness Analysis from Digital Surf

Digital Surf have released the latest version of the texture and roughness analysis software, Mountains Map 6. This software package is suited to instruments such as optical profilometers, confocal microscopes, scanning probe and atomic force microscopes and can deal with samples as large as automotive panels down to AFM size of just a few microns. The latest version of Mountain Map has new features such as phase overlay and 64-bit compatibility for accelerated analysis.

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Fast Scanning Demonstration with the Asylum Research Cypher AFM

This demonstration shows the Cypher AFM from Asylum Research scanning atomic steps on an etched mica sample. The real time video shows how fast the Cypher is able to scan the sample. In this case the scan area starts off as 2.35µm and then changes to smaller areas as the operator selects new zones to investigate.

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Brief Tutorial and Overview of Nanosurf CoreAFM

This video demonstrates the main features of Nanosurf's CoreAFM, and gives a brief tutorial on how to perform a measurement using CoreAFM system. The tutorial explains about mounting a cantilever, preparing samples, and carrying out a measurement.

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DNA Image at 1 F/S with Dimension FastScan

This video shows the DNA image taken in the tapping mode in the fluid at a rate of 1 frame per second using the Dimension FastScan atomic force microscope (AFM) from Bruker.

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Consecutive Images of Lipid Bilayer at 0.5 f/s

This video shows the consecutive AFM (atomic force microscopy) height images (image size = 3µm; z-scale = 3.2nm) of the lipid bilayer captured at 0.5 f/s with 20x50 frames using TappingMode and Dimension FastScan Bio AFM from Bruker Nano Surfaces.

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Atomic Force Microscopy and Raman Spectroscopy Applications

This webinar from Nano Surfaces Division, Bruker, examines the applications of co-localized atomic force microscopy (AFM) and Raman spectroscopy. It also covers the tip enhanced Raman scattering (TERS).

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The SmartSPM from AIST-NT

In this video we learn about the SmartSPM from AIST-NT. We see a demonstration of how easy the SmartSPM is to set up, and in the space of a few minutes have even taken a series of measurements.

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Possible AFM Modes and Their Nanomedicine Applications

This video presentation from Bruker Nano Surfaces shows the possible AFM (atomic force microscopy) modes and their nanomedicine applications.

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Nanoassembly Using a Nanohand

This video shows how to pick and place nanofibres using a nanohand, to construct a nanodevice: a super-probe for atomic force microscopy.

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Electrochemical Strain Microscopy and the Cypher AFM from Asylum Research

Asylum Research introduced the Cypher AFM two years ago. They have now added a new technique called Electrochemical Strain Microscopy to its list of capabilities. Sergei Kalinin from Oak Ridge National Laboratory explains how this technique can be used to characterize electrochemical phenomena at the nanoscale and Roger Proksch from Asylum Research demonstrates how the system produces data and its relevance to the field of battery materials.

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