Posted in | Atomic Force Microscopes

Enhancement of Traditional Electron Microscopy Applications with AFM from Bruker

This Bruker Nano Surfaces video illustrates the latest advances in electron microscopic techniques that provide a highly productive non-imaging workflow with AFM. Improvements in material characterization, speed and productivity/usability are creating a new development in research fields and work environments.

This video reviews and compares the range of applications where AFM offers additional information and provides a potentially easier path to research results.

Run Time – 1:05:13hr

AFM | Enhancing Traditional Electron Microscopy Applications | Bruker

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