Posted in | Atomic Force Microscopes | Nanoanalysis

Dimension FastScan with ScanAsyst AFM Imaging Mode

This video from Bruker illustrates the working principle of the Dimension FastScan atomic force microscope (AFM) with ScanAsyst and unattended high-speed imaging on a variety of samples.

Also shown in this video are the details of the scan parameters, the unattended nature of the AFM operation as well as auto-optimization of the system on each sample.

Run Time – 4:28min

Dimension FastScan and ScanAsyst - Fast unattended AFM Imaging

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