Posted in | Atomic Force Microscopes | Nanoanalysis

Scan of Polysilicon with Dimension FastScan

This video shows a 2 µm x 2 µm, 512 pixel x 512 pixel image of Polysilicon obtained using Bruker’s Dimension FastScan atomic force microscope (AFM).

A high-quality TappingMode image is obtained at 22 Hz (88 µm/s tip velocity) at a time rate of 24 s/image frame. The Dimension FastScan provides high resolution and delivers high performances on any sample.

Run Time – 1:10min

Polysilicon at 22Hz with FastScan

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