Posted in | Atomic Force Microscopes | Nanoanalysis

Scan of Diffraction Grating with Dimension FastScan

This video illustrates a 180 nm, 30 µm, 11 Hz, scan of diffraction grating taken with Bruker’s Dimension FastScan atomic force microscope (AFM).

The Dimension FastScan provides high resolution and delivers high performance on any sample. With the help of this Dimension FastScan AFM, users can obtain well-defined phase images.

Run Time – 1:00min

FastScan Grating 180nm 30um 11hz.wmv

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