Posted in | Atomic Force Microscopes | Nanoanalysis

Scan of Celgard with Dimension FastScan

This video demonstrates a 1 µm, 23 Hz, scan of freshly prepared Celgard with perpendicular mesh orientation using Bruker’s Dimension FastScan atomic force microscope (AFM).

The Dimension FastScan phase images on the top surface are well defined. A high resolution of 512x512 is obtained with this high-speed AFM.

Run Time – 1:04min

Celgard(R), 1um, 23Hz, Perpendicular Mesh Orientation

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