Pittcon 2009 Video Interviews Videos

Michael Haschke from Bruker AXS shows us thorugh their new range of Micro XRF (X-Ray Fluorescence) instruments.

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The WITec microscopy series features scanning probe as well as high resolution optical and Raman microscopy techniques in either a single instrument or combined system configurations for the highest flexibility throughout a wide range of microscopy applications.

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Lumencor was formed to design lighting technology for life science applications. Claudia Jaffe from Lumencor introduces us to their Light Engine which is an all-in-one device that combines: power; durability; discreetness, spectral cleanliness; long life; cool operating temperature; small footprint and; cost effectiveness.

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Ulf Nobbmann from Malvern Panalytical shows us through the Zetasizer Nano, which uses dynamic light scattering to determine particle size, as well as being able to determine zeta potential.

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The N8 NEOS combines optical microscopy and Scanning Probe Microscopy in a single, optimized set - up.

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Janie Dubois from Malvern Panalytical takes us for a tour of the Morphologi G3 particle characterization system. The Morphologi G3 is a microscope based system that analyzes particles based on actual images.

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Mike Wolfe from Nikon Instruments, the distributor for the JEOL Neoscope JCM-5000 in North America and Canada demonstrates the capabilities if this compact benchtop scanning electron microscope (SEM), which is a natural extension from high end optical microscopes, but offers much better depth of field.

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Nanosight have developed a unique technique for detecting and viewing nanoparticles in real time using laser light. Jeremy Warren explains how it work and the key components to their system

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David Coler from PANalytical shows us through the AXIOS XRF (x-ray fluorescence) instrument that performs elemental analysis. It is suited to applications including industrial process control, in the cement, steel and petroleum industries, as well as research and development applications in both industry and academia.

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In this exclusive interview with Barbara Foster from the Microscopy and Imaging Place or The MIP conducted at Pttcon 2009, we learn about a new market report. It is in fact the first ever global report on the AFM market place using feedback from AFM users themselves.

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Tim Drake from Aspex Corp shows us the main features of the Personal Scanning Electron Microscope, PSEM eXpress, which is designed for rapid sample analysis. In particular, this compact benchtop SEM features a large sample chamber and easy loading mechanism.

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