Posted in | Pittcon 2009 Video Interviews

Neos AFM from Bruker AXS - Features and Applications

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Dave Sampson from Bruker AXS shows us through the N8 NEOS atomic force microscope from Bruker AXS

The N8 NEOS combines optical microscopy and Scanning Probe Microscopy in a single, optimized set - up. The combination of the NANOS AFM / SPM and a high power optical microscope on a highly rigid granite stand makes the N8 NEOS a highly effective and exceptionally versatile inspection system.

Due to its proprietary, sturdy design, the SPM performance reaches down to an atomic resolution level. Using a strong, yet extremely precise vertical motion stage allows to measure even on very heavy and large samples. The N8 NEOS can be easily adapted to special requirements and customers' wishes: from manually positioning to high precision joystick automatization, from liquid cell observation on biological tissue to the industrialized inspection in quality control. All AFM/SPM modes and optical contrast techniques are available, making the N8 NEOS the ideal inspection tool where the ultimate performance is required.

Run time: 2.48 mins

Bruker Neos AFM

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