Posted in | Atomic Force Microscopes | Nanoanalysis

Materials Characterization with the NanoIR from Analsys Instruments

Curt Marcott from Light Light Solutions tells us how the NanoIR from Anasys Instruments has opened up new possibilities in materials characterization. Combining AFM and IR spectroscopy provides spatial resolution an order of magnitude better than conventional IR, which enables researchers to do such things as examine nanoparticles in a matrix, or analyze for compositions differences across in interface.

Curt provides some examples from his own work, but also says that as a relatively new technique, their are many more potential applications where it will be useful

Run time - 6:44min

Characterizing Materials with the NanoIR from Anasys Instruments

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