Nanoelectronics News

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Synopsys Announces Availability of DesignWare SATA PHY IP in SMIC 130nm Process Technology

LayTec EpiCurve Metrology System Used to Develop New Growth Rate Method for AlN Layers

LayTec EpiCurve Metrology System Used to Develop New Growth Rate Method for AlN Layers

IMEC Calls for True European Collaborations

Fraunhofer-Gesellschaft Opens Center for Organic Materials and Electronic Devices Dresden

Fraunhofer-Gesellschaft Opens Center for Organic Materials and Electronic Devices Dresden

How Defects Make Nano-Objects Better

How Defects Make Nano-Objects Better

mPhase Showcases Smart NanoBattery at Nanotechnology Event

mPhase Showcases Smart NanoBattery at Nanotechnology Event

300 mm TSV RIE Tool to be Installed at SEMATECH's 3D R+D Center at UAlbany NanoCollege

NXP Semiconductors Selects ATREG as its Agent in the Sale of their IPD Business and 150mm Fab in France

The Mysteries of Physics on the Nanoscale

The Mysteries of Physics on the Nanoscale

Analyzing Nanoscale Dimensions with Nanoscale Measurement Sensitivity Quickly and Cheaply

Analyzing Nanoscale Dimensions with Nanoscale Measurement Sensitivity Quickly and Cheaply

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