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Research and Markets Releases Report to Study the International Market for Advanced Microscopes

Research and Markets has declared that it has added a report, called the "The World Market for Advanced Microscopes - Electron and Scanning Probe.”

3 Jun 2011

Hitachi Launch SEM with Sub-Nanometer Resolution

The new SU9000 Field Emission (FE) Scanning Electron Microscope (SEM) from Hitachi High-Technologies features novel electron optics which allow 0.4 nm resolution to be achieved at an accelerating voltage of 30 kV, with a usable magnification up to 3 Million times.

31 May 2011

Researchers at UC Santa Barbara to Use Nanoscopic Imaging Methods to Study the Myelin Sheath

The chemical engineers at UC Santa Barbara are working on new experiments that are likely to be of great help in detection and diagnosis of pathological tissue related diseases.

31 May 2011

X-Ray Spectroscopy Enables Atomic-Level Mapping

FEI enhanced its ChemiSTEM Technology to facilitate energy dispersive X-ray (EDX) spectroscopy at the atomic level, which can be implemented for all the elements in the periodic table.

24 May 2011

Olympus to Exhibit at European Society for Precision Engineering and Nanotechnology

Olympus will be exhibiting at the upcoming European Society for Precision Engineering and Nanotechnology (EUSPEN) 11th International Conference and Exhibition in Lake Como, Italy from 23 – 26 May 2011. With expertise in the field of optical metrology, Olympus will display its LEXT OLS4000 confocal laser scanning microscope (CLSM) at booth 1314, as well as present an informative poster and participate in the commercial session.

23 May 2011

Nano-Gyroscope with Optical Sensor for Medical and Security Applications

Jacob (Koby) Scheuer, a researcher at the Tel Aviv University (TAU) of Electrical Engineering, Israel, has designed a nano- gyroscope. An optic-fiber nano-sensor had been designed four years earlier, together with an optic gyroscope that operates in combination with the sensor.

20 May 2011