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First Off-the-Shelf High Resolution Sensor using Tower's Advanced 0.18-micron CIS Technology

First Off-the-Shelf High Resolution Sensor using Tower's Advanced 0.18-micron CIS Technology

IMEC to Collaborate on Novel Packaging Technologies for Flexible Electronics

IMEC to Collaborate on Novel Packaging Technologies for Flexible Electronics

Multi-Project Wafer Program Provides Economical Access to Flexfet Advanced Multiple Independent Gate FET CMOS Technology

Synopsys Announces Special Three-Way Technical Session and Breakfast at ARM TechCon3

NCKU Signs Agreement with Taiwan Nitride Material for Production of Aluminum Nitride

UMC Completes EPD Verification for Integrated Circuit Wafers Produced at its Facilities

SMIC Adopts Cadence Solutions to Predict Stress and Lithographic Variability on Performance of 65- and 45-nm Semiconductor Designs

SMIC Adopts Cadence Solutions to Predict Stress and Lithographic Variability on Performance of 65- and 45-nm Semiconductor Designs

Results Prove SOI-Based Planar CMOS Meets Requirements for Low-Power, 22nm Node Devices

Results Prove SOI-Based Planar CMOS Meets Requirements for Low-Power, 22nm Node Devices

Samsung's Latest Chip Innovation Combines RF and Digital Chip Components into Single 65 nm Chip

Mentor Graphics Enters into Multi-Year Software and Services Agreement with GLOBALFOUNDRIES

Mentor Graphics Enters into Multi-Year Software and Services Agreement with GLOBALFOUNDRIES

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