Posted in | News | Nanoelectronics

Advanced Micro-Fabrication Equipment’s Etch Tool for Critical Process Challenges at 22 nm and Beyond

Advanced Micro-Fabrication Equipment is unveiling its second-generation 300 mm ultra-high frequency advanced decoupled reactive ion etch (AD-RIE) system called the Primo AD-RIE tool, which is ideal for major process challenges at 22 nm and beyond at SEMICON West.

Primo AD-RIE Device

The Primo AD-RIE tool has technical advancements over its predecessor tool Primo D-RIE to assure better performance for on-wafer, while handling the difficulties in the manufacturing of leading-edge film stacks. It features improved chamber materials for minimum defects and better yields, superior flexible technologies to ensure ultra-precise uniformity of critical dimension and an innovative RF system for process repeatability and constancy.

The Primo AD-RIE features a unique mini-batch cluster design, that can include about three dual-station process modules for maximum output. Each module has the potential to process a single- or dual-wafer. The chamber’s novel design with showerhead technique and proprietary plasma confinement allows superior performance for on-wafer. A unique ESC improves temperature control for wafers and maximizes CD uniformity.

The etch tool Primo AD-RIE reduces cost of ownership by 20% to 40% and offers 35% to 50% of capital productivity gain. Its numerous critical features make it suitable for important process necessities at sub-28 nm.

Advanced Micro-Fabrication Equipment will deliver the first Primo AD-RIE in the third quarter of 2011 to a tier-one foundry in the Asian market. The utilization of predecessor Primo D-RIE device will be continued for all types of purposes over 22 nm, and for less important uses at 22 nm and beyond.

Citations

Please use one of the following formats to cite this article in your essay, paper or report:

  • APA

    Chai, Cameron. (2019, February 12). Advanced Micro-Fabrication Equipment’s Etch Tool for Critical Process Challenges at 22 nm and Beyond. AZoNano. Retrieved on November 21, 2024 from https://www.azonano.com/news.aspx?newsID=22975.

  • MLA

    Chai, Cameron. "Advanced Micro-Fabrication Equipment’s Etch Tool for Critical Process Challenges at 22 nm and Beyond". AZoNano. 21 November 2024. <https://www.azonano.com/news.aspx?newsID=22975>.

  • Chicago

    Chai, Cameron. "Advanced Micro-Fabrication Equipment’s Etch Tool for Critical Process Challenges at 22 nm and Beyond". AZoNano. https://www.azonano.com/news.aspx?newsID=22975. (accessed November 21, 2024).

  • Harvard

    Chai, Cameron. 2019. Advanced Micro-Fabrication Equipment’s Etch Tool for Critical Process Challenges at 22 nm and Beyond. AZoNano, viewed 21 November 2024, https://www.azonano.com/news.aspx?newsID=22975.

Tell Us What You Think

Do you have a review, update or anything you would like to add to this news story?

Leave your feedback
Your comment type
Submit

While we only use edited and approved content for Azthena answers, it may on occasions provide incorrect responses. Please confirm any data provided with the related suppliers or authors. We do not provide medical advice, if you search for medical information you must always consult a medical professional before acting on any information provided.

Your questions, but not your email details will be shared with OpenAI and retained for 30 days in accordance with their privacy principles.

Please do not ask questions that use sensitive or confidential information.

Read the full Terms & Conditions.