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Results 91 - 100 of 6304 for Process Control
  • Supplier Profile
    LayTec develops, manufactures and markets optical in-situ and in-line metrology systems for thin-film processes with particular focus on compound semiconductor and photovoltaics applications. Our...
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    The Center is the living, national memorial to President Wilson established by Congress in 1968 and headquartered in Washington, D.C. It is a nonpartisan institution, supported by public and private...
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    Argonne National Laboratory is one of the U.S. Department of Energy's largest research centers. It is also the nation's first national laboratory, chartered in 1946. Argonne is a direct...
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    Elkington and Fife LLP is a leading firm of patent and trade mark attorneys dealing with all areas of technology.  The firm has offices in Central London and Sevenoaks, Kent. Elkington and Fife...
  • Supplier Profile
    Cymer, the world's leading supplier of excimer light sources, delivers the deep ultraviolet (DUV) photolithography sources that are essential to today's semiconductor marketplace. Known for...
  • Supplier Profile
    Since 1970, Aerotech has designed and manufactured the highest performance motion control and positioning systems for our customers in industry, government, science, and research institutions around...
  • News - 8 Dec 2017
    Nanometrics Incorporated (NASDAQ:NANO), a leading provider of advanced process control systems, today announced that its IMPULSE®+ integrated metrology platform has been adopted into key...
  • News - 3 Oct 2017
    In the case of nanoparticle self-assembly, seeing is believing. Engineers from the University of Illinois are studying the interactions of colloidal gold nanoparticles within miniature aquarium-like...
  • News - 21 Jul 2016
    A team of researchers have demonstrated a way to manipulate the "electron spin" of a nanodiamond when it is levitated using lasers in a vacuum. This innovative method has potential in applications...
  • News - 20 Jun 2016
    FEI announced today the release of three new tools for process control and defect/failure analysis in advanced semiconductor manufacturing. Two of the tools are specifically targeted at the 7nm node,...

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