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Results 11 - 20 of 96 for Polysilicon
  • LDK Solar Signs New Agreement with GT Solar to Purchase Polysilicon CVD Reactors
    News - 4 Sep 2008
    LDK Solar Co., Ltd., a leading manufacturer of solar wafers, today announced it has signed a new agreement with GT Solar International, Inc. to purchase polysilicon CVD reactors for installation in...
  • U.S. Company To Increase Export Of Polysilicon Production Equipment To South Korea
    News - 3 Sep 2008
    GT Solar Incorporated, a global provider of specialized equipment and technology for the solar power industry, announced that on July 11, 2008, it signed a $173 million contract with DC Chemical Co.,...
  • Trina Solar Signs Long-Term Polysilicon Supply Agreement with GCL Silicon Technology
    News - 25 Aug 2008
    Trina Solar Limited, a leading integrated manufacturer of solar photovoltaic products from the production of ingots, wafers and cells to the assembly of PV modules, founded in 1997, today announced...
  • Scan of Polysilicon with Dimension FastScan
    Video
    This video shows a 2 µm x 2 µm, 512 pixel x 512 pixel image of Polysilicon obtained using Bruker’s Dimension FastScan atomic force microscope (AFM).
  • XEI Scientific
    Supplier Profile
    XEI Scientific, Inc. was founded in 1991 by Ronald Vane to provide an effective way to gently clean scanning electron microscopes (SEMs), focused ion beams (FIBs) and other vacuum systems. XEI...
  • CEMES
    Supplier Profile
    The "Centre d’Élaboration de Matériaux et d’Etudes Structurales" (CEMES/CNRS) is a CNRS laboratory (UPR 8011) associated with Université Paul Sabatier de Toulouse...
  • Scanwel Probes
    Supplier Profile
    Scanwel is your authorised distributor of high quality Scanning Probe Microscope (SPM) accessories from NT-MDT. In Scanning Probe Microscopy, the perfect instrument is only half of the story. The...
  • Bruker Nano Surfaces and Metrology
    Supplier Profile
    Bruker Nano Surfaces and Metrology provides high-performance, specialized analysis and testing technology for the widest range of research and production applications. Our broad portfolio of 2D and...
  • Characterization of Thin Film Transistors
    Article - 26 May 2008
    Spectroscopic ellipsometry characterizes TFT-LCD panels, assessing a-Si and LTPS layer thickness, optical constants, and p-Si grain size with high accuracy.
  • High-k Dielectric Films and Metal Gates Are Positioned to Grow 25 Percent by 2012
    News - 28 Oct 2008
    The continued miniaturization of integrated circuits is creating a new, rapidly growing nanoelectronic chemicals market. These include dielectric and copper plating materials that have exact...

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