Thin films - AZoNano Search

Microscale Spatially Resolved Fracture Toughness Determination Using Micropillar Splitting

Article - 19 Feb 2019

Micropillar splitting for microscale spatially resolved fracture toughness determination.

Making Cryogen Free Measurements: Challenges and Solutions

Article - 9 Jan 2019

In this interview, Michael Cuthbert highlights the main challenges researchers face when performing cryogen free measurements.

Is the Future Nano?

Article - 31 May 2018

Future of Nanotechnology is an active topic of discussion among researchers, futurists, industrialists, technologists, engineers as well as people of non-scientific backgrounds. Since nanotechnology...

Dicing Sapphire Wafers

Article - 25 Apr 2018

Cleaving is a fast and simple method used for preparing samples of semiconductor materials, including silicon. In contrast, sapphire does not cleave well, despite being a single crystal.

A History of Carbon Nanotubes

Article - 23 Apr 2018

In 1991, Iijima discovered carbon nanotubes (CNTs). Since then, a new branch of knowledge in materials science has emerged – Nanoscience. In order to unveil the secrets of the innovative materials,...

Recent Advances of Nanotechnology in Transportation

Article - 12 Apr 2018

This article is on the applications of nanotechnology in transportation. Nanomaterials exhibit different chemical & physical properties, such as size distribution, surface area to volume ratio,...

In-Situ Mechanical Testing of Semiconductor Devices

Article - 26 Aug 2017

As semiconductor devices improve in performance, changes in materials and processing methods are needed. In this article, the Hysitron® PI 85L SEM PicoIndenter® is used to examine failures and...

Atomic Force Microscopy (AFM) Vs Photo-Induced Force Microscopy (PiFM)

Article - 27 Jul 2017

There is a new form of microscopy available on the marketplace known as photo-induced force microscopy (PiFM), which shows great similarities, and can be used in conjunction, with atomic force...

Characterizing 2D Materials with AFM-IR Spectroscopy

Article - 9 Oct 2019

The Anasys nanoIR3 AFM-IR spectrometer allows scientists to observe, image and characterize 2D materials at the nanoscale.

Raman and UV-Vis-NIR Microspectroscopy to Sort Carbon Nanotubes

Article - 20 Apr 2017

Carbon nanotubes (CNT) can be considered as graphene which forms a tube instead of a sheet. CNT is considered to be a one-dimensional material composed of a different set of properties than two...