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  • Supplier Profile
    PhyMetrix, Inc. is a manufacturer of the world's first Nanotechnology based dewpoint meters. PhyMetrix has a manufacturing facility complete with R&D Lab, Testing, Engineering and...
  • Supplier Profile
    XOS® has been a leading global provider of advanced X-ray optics for material analysis systems since the optics’ commercial introduction in the mid-1990s. The systems are important for...
  • Supplier Profile
    Quantum Precision Instruments Pty Ltd (QPI) has been in operation since late 1999. In 2004 Quantum Precision Instruments Asia Pte Ltd has been incorpoarated in Singapore. In 2006 both companies have...
  • Supplier Profile
    QPI is developing a patented technology platform of atomic precision positioning metrology devices for microelectronics and sensors for use in medicine, bio-technology, aviation, defence, automotive,...
  • Supplier Profile
    Sigma-Aldrich® is a leading high-technology company. Through our Materials Chemistry Centers of Excellence in research and manufacturing we develop advanced, enabling materials for your...
  • Supplier Profile
    STOE develops, manufactures and sells scientific instruments for the non-destructive analysis of substances. Based on the X-ray diffraction (XRD) method, these systems characterize single crystals and...
  • Supplier Profile
    Leti is an institute of CEA, a French research-and-technology organization with activities in energy, IT, healthcare, defence and security. Leti is focused on creating value and innovation through...
  • Supplier Profile
    The National University of Singapore (NUS) acknowledges the global trend that nanotechnology is expected to be a key technology. NUS, in tradition of spearheading cutting-edge research programs, has...
  • News - 18 Feb 2016
    Oxford Instruments and SPECS Surface Nano Analysis GmbH have entered an agreement whereby Oxford Instruments NanoScience will be the sole distributor of SPECS Nanonis TrameaTM quantum transport...
  • Equipment
    The Hiden SIMS workstation is designed to handle high performance static and dynamic SIMS applications for detailed surface composition analysis and depth profiling.

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