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  • Real-time Imaging of Nanoparticle Restructuring
    Article - 24 Apr 2017
    Researchers from Temple University and Argonne National Lab have discovered an imaging method based on combined X-ray scattering and computer simulations that turns the dream into reality.
  • The World's First Nano-Car Race
    Article - 10 Apr 2017
    The National Center for Scientific Research (CNRS) of France is currently in the process of organizing the world’s first international nanocar race which will be broadcasted live on the YouTube...
  • Combining AFM with XPS to Analyze Graphene Oxide Membranes
    Article - 23 Mar 2017
    Graphene oxide (GO) is a two-dimensional nano-material consisting of a graphene monolayer highly functionalized with oxygen-containing chemical groups.
  • Using Metal Oxide Nanocolumns to Detect Fire
    Article - 1 Mar 2017
    A team of Korean scientists have announced a selection of metal oxide sensors that can detect these gases faster than commercially available detectors; and potentially be used in a new line of...
  • The History Of Electronics & Semiconductors
    Article - 31 May 2016
    Materials that contain both the properties of a conductor and an electrical insulator are known as semiconductors.
  • Latest Trends in AFM
    Article - 27 May 2016
    Atomic force microscopy (AFM) was first used in 1986 and uses a cantilever with a sharp tip to scan across a sample to produce a topographic map. The process is now expanding its use over a range of...
  • Using XPM for Quantitative Ultra-High Speed Mechanical Property Mapping
    Article - 13 May 2016
    An innovative standard has been set by set by Bruker’s Hysitron XPM in the area of nanomechanical testing throughput, coupled with precision and measurement resolution.
  • Types and Preparation of Nanomaterials
    Article - 17 Nov 2015
    Nanomaterials are, as defined by Standford University's Environmental Health & Safety Department as "materials with a minimum of one external dimension that ranges in size between 1-100 nanometers
  • Depth Profile Analysis Using Focused Ion Beam-Secondary Ion Mass Spectrometry
    Article - 19 Jan 2016
    Strict regulatory and energy conservation requirements imposed on the construction and design of modern buildings in recent years have provided challenges for the glass industry. Thin material-coated...
  • The Absolute Quantification of Ion Fluxes from Deuterium from an ECR Plasma Source
    Article - 28 Jul 2015
    Technical processes like thin-film deposition, etching and surface modification extensively use plasma discharges. Hence, it is important to quantitatively characterize plasma sources for...

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