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Ballistic Superconductivity Shown in InSb Nanowires

Semiconducting nanowires have opened up the field of quantum transport, and this is largely due to their confined geometry and electrostatic tunability.

By Liam Critchley 13 Jul 2017

An Introduction to Photo-Induced Force Microscopy (PIFM)

PiFM is a scanning probe (spectroscopic probing) method which allows for the imaging of optical near-fields in nanoscale structures that can map their morphology and obtain spectroscopic information, all with high spatiotemporal resolution of less than 10 nm and broadband spectral sensitivity.

By Liam Critchley 13 Jul 2017

New Method of 3D Plasmon Tomography

Researchers from the University of Graz’s Institute of Physics and Institute for Electron Microscopy and Nanoanalysis have recently demonstrated a new method for 3D reconstruction of plasmonic nearfields.

By Benedette Cuffari 6 Jul 2017

Carbon Nanospheres Coated with Titanium Dioxide and Zinc Oxide

Researchers have developed carbon nanospheres (CNSs) using a hydrothermal method, and coated them with TiO2 and ZnO layers by atomic layer deposition (ALD).

From Avantes BV 6 Jul 2017

Removing Waste Through Photocatalytic Nanocomposite Fibres

As environmental concerns surrounding water pollution grows, there is a need for one or more solutions to combat worldwide problems.

From Kratos Analytical, Ltd. 4 Jul 2017

Researchers Create Self-Assembled Cubic Boron Nitride Nanodots

Researchers develop a self-assembly method using MBE to create high-quality, pure cubic Boron Nitride Nanodots for advanced applications.

From HORIBA 4 Jul 2017

Researchers Rearrange Atoms to Create 2D-Layered MoS2 from an Amorphous Film

Two-dimensional (2D) transition metal dichalcogenides (TMDCs), which show a semiconducting band gap, have attracted a lot of attention recently due to their remarkable electronic and optical performance.

From Oxford Instruments WITec 4 Jul 2017

Using SP-ICP-MS to Analyze CeCO2 Chemical Mechanical Planarization Slurries

SP-ICP-MS effectively measures large particle concentrations in CeO2 CMP slurries, critical for minimizing wafer damage in semiconductor manufacturing.

From PerkinElmer Inc. 30 Jun 2017