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Using Combined Fluorescence Lifetime Imaging Microscopy and Atomic Force Microscopy to Perform Enhanced Multiparameter Cell Imaging

Fluorescence lifetime imaging microscopy (FLIM) offers optically encoded data about live cells processes. In contrast, atomic force microscopy (AFM) provides mechanical and nanometer-resolved surface topography data, and has now been extended to mechanical property mapping of nanometer-resolved live cells.

From Bruker Nano Surfaces and Metrology 25 May 2016

Using Scanning Microwave Impedance Microscopy for Nanoscale Mapping of Permittivity and Conductivity

Scanning microwave impedance microscopy, also known as sMIM, is an atomic force microscopy (AFM)-based method used for the characterization of materials and devices.

From Bruker Nano Surfaces and Metrology 25 May 2016

High-Resolution, Quantitative Work Function Measurements with PeakForce Kelvin Probe Microscopy (KPFM)

Frequency modulation PeakForce Kelvin Probe Microscopy (FM- KPFM) and amplitude modulation KPFM (AM-KPFM) are the two critical KPFM detection methods. This article provides an intuitive and geometrically rational probe model to describe their radical variations in spatial resolution and precision.

From Bruker Nano Surfaces and Metrology 25 May 2016

What Will Graphene Be Used For?

Discovered less than a decade ago, graphene is a “super material” that has engineers in many different fields excitedly pursing varied uses for it. Graphene is made of carbon in a honeycomb-lattice and is just one atom thick. It is a very good conductor of heat and electricity, virtually transparent

By Brett Smith 18 May 2016