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Mechanical Characterization of Ultra Low-k Dielectric Films

Dielectric films play a vital role in the performance of microelectronic devices, because they have the potential to electrically separate conductive components from one another in microcircuits.

From Bruker Nano Surfaces and Metrology 13 May 2016

Dynamic Testing Technique to Perform Nanoscale Mechanical Property Measurements

The nanoDMA III from Hysitron is the latest powerful dynamic testing method to perform nanoscale mechanical property measurements.

From Bruker Nano Surfaces and Metrology 13 May 2016

Gold Nanorods Synthesized Without CTAB

This article details the features and properties of gold nanorods synthesized without CTAB.

From Strem Chemicals 15 Apr 2016

How to Accurately Profile the Topography of Laser-Ablated Surfaces

This article talks about how to accurately profile the topography of laser-ablated surfaces.

From KLA Instruments™ 8 Apr 2016

Sample Preparation Techniques for Dynamic Light Scattering Experiments

Optimizing sample preparation is crucial for precise Dynamic Light Scattering results, considering factors like dispersion, diluents, and surfactants.

From Entegris 25 Mar 2016

Nanoparticle Decoration of Carbon Nanotubes by Sputtering

Carbon nanotubes (CNTs) that have been decorated with nanoparticles are effective biological and chemical sensors, photovoltaics, electronic conformal thermal interface substances, and surfaces for heterogeneous catalysis

From Hiden Analytical 22 Mar 2016

Complementary Orthogonal and Nanoparticle Characterization Techniques - Combining Dynamic Light Scattering with Nanoparticle Tracking Analysis

The frequent problem for many Researchers using particle measurement instrumentation is the reliability of the measured data.

From Malvern Panalytical 7 Mar 2016

NTA - Nanoparticle Toxicity

NTA emerges as a key method for analyzing nanoparticle toxicity, aiding in environmental impact studies and toxicity testing.

From Malvern Panalytical 7 Mar 2016

NTA - Environmental Impact of Nanoparticles

NTA emerges as a key method for sizing and concentration analysis of nanoparticles, aiding environmental impact studies and toxicity assessments.

From Malvern Panalytical 7 Mar 2016

Characterizing Graphene with Atomic Force Microscopy and PeakForce Tapping

Atomic-force microscopy is a type of scanning probe microscopy with sub-Ångstrom resolution. It is able to gather data on the mechanical and electrical properties of materials and surfaces by ‘feeling’ or ‘touching’ the surface with a cantilevered mechanical probe [1] controlled by Piezoelectric components.

From Bruker Nano Surfaces and Metrology 7 Mar 2016