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Determining the Zeta Potential - Dispersion Characterization Instrumentation Available from Particle Technology Labs

Particle Technology Labs is a premier service laboratory, dedicated to quality particle size and characterization. Services include Particle Size, Surface Area/Pore Size, Image Analysis, Photomicroscopy, Powder Rheology, Zeta Potential, Density and Physical Measurements.

From Particle Technology Labs 16 Jul 2008

Particle Size Distribution Analysis of Nano-Particles - Photon Correlation Instrumentations Available from Particle Technology Labs

From Particle Technology Labs 16 Jul 2008

Current and Future Development in Ceramics - An Interview with The American Ceramic Society

More recently the the ACerS have rolled out a new web site offering more to members, including news and access to the well respected Journal of the American Ceramic Society and access to new phase equilibria diagrams, currently number over 20,000.

15 Jul 2008

Single Walled Carbon Nanotubes, SWNTs, Specifications and Properties

This article looks at single walled carbon nanotubes (SWNTs) from Cheap Tubes Inc that are CCVD grown and acid purified offering the best match of price and performance

From Cheap Tubes Inc. 27 May 2008

Purified Multi Walled Carbon Nanotubes, MWNTs and Their Properties

Purified multi walled carbon nanotubes (MWNTs) and their properties

From Cheap Tubes Inc. 27 May 2008

How Carbon Nanotubes Are Made and How Carbon Nanotubes are Used

This article looks at FAQ's about carbon nanotubes and their use in nanotechnology including how carbon nanotubes are made and their unique properties

From Cheap Tubes Inc. 27 May 2008

Carbon Nanotube Applications and the Properties of Carbon Nanotubes

This article shows the properties and applications of single walled and mutli walled carbon nanotubes

From Cheap Tubes Inc. 27 May 2008

Characterization of Thin Film Transistors

Spectroscopic ellipsometry characterizes TFT-LCD panels, assessing a-Si and LTPS layer thickness, optical constants, and p-Si grain size with high accuracy.

From HORIBA 26 May 2008