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Korean Memory Manufacturer Selects Nanometrics Unifire Metrology System

Nanometrics Incorporated (Nasdaq: NANO), a leading provider of advanced process control metrology systems, today announced that a major Korean memory manufacturer has accepted its UniFire 7900 metrology system for proces...

3 May 2011

Analysis of Nano-particles of Volcanic Ash to Predict Airspace Safety

Teams at the University of Copenhagen research and University of Iceland have created a platform to offer air traffic authorities the data essential to decide whether planes need to be grounded when ash from volcano eruptions threaten aircraft safety.

29 Apr 2011

EV Group Declares CEA-Leti Has Incorporated EVG Tools in its 300mm Clean-Room

EV Group recently declared that CEA-Leti has incorporated multiple EVG tools in its 300mm clean-room for research and development and developing three-dimensional integration applications.

From CEA-Leti 25 Apr 2011

QES Introduces Altatech Wafer Inspection Platforms and Liquid-Precursor AltaCVD Solutions

Altatech Semiconductor has signed QES Singapore as its sales, installation and field service partner in Singapore. QES Singapore will introduce Altatech Semiconductor products and solutions to its client network in Souteast Asia.

25 Apr 2011

EPSRC Centre to Establish Underpinning Technology in Measurement Science to be Applicable for Nano Scale Surfaces

The Royal Society Senior Research Fellow Professor Xiangqian (Jane) Jiang, chief scientist at the Centre of Precision Technologies heads the EPSRC Centre for Innovative Manufacturing in Advanced Metrology that was inaugurated on April 8 at an event introducing nine new Centers for Innovative Manufacturing (CIM).

16 Apr 2011

RNA Sequencing Helps Develop Self Assembling Nano Square

A team of scientists at the University of California San Diego have recently developed a high resolution design of a nano-scale square fabricated from ribonucleic acid, or RNA.

12 Apr 2011

Joint Venture to Speed Up I-O Cell Classification with Nanometer SPICE Precision

Santa Clara, California-based Berkeley Design Automation and Altos Design Automation, recently declared that the Berkeley Analog FastSPICE Platform will be incorporated into the Liberate product from Altos in an endeavor to speed up complicated I/O cell classification with nanometer SPICE precision, such as impacts of noise and design parasitics.

12 Apr 2011

New Series of Educational Videos on the Science of Materials Characterization

Micromeritics has begun producing an ongoing series of short educational videos. Of interest to scientists, researchers, laboratory technicians, and students alike, this video series will cover various topics focusing on the science of material characterization.

From Micromeritics International Sales 11 Apr 2011

Next Generation Materials Characterisation System from Oxford Instruments Integrates Microanalysis Techniques

Oxford Instruments NanoAnalysis, the world leader in Microanalysis systems announces the launch of AZtec, its next generation materials characterisation system. AZtec is designed to integrate all microanalysis techniques...

From Oxford Instruments NanoAnalysis 11 Apr 2011

Evactron Decontaminator Cleans Carbon Contamination with Hydrogen

XEI Scientific Inc, maker of the popular EVACTRON® Plasma Cleaning System for electron microscopes and other vacuum chambers, reports the use for cleaning carbon decontamination using hydrogen.

From XEI Scientific 5 Apr 2011