Nanoanalysis News

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JPK Instruments Expand Asian Operations

JPK Instruments, a world-leading manufacturer of nanoanalytic instrumentation for research in life sciences and soft matter, is pleased to announce the expansion of their operations in Asia.

From Bruker BioAFM 9 Feb 2011

Worms Exhibit Cheerios Effect While Swimming on Thin Water

Nematodes, microscopic worms, are making engineers look twice at their ability to exhibit the "Cheerios effect" when they move in a collective motion. These parasites will actually stick together like Cheeri...

9 Feb 2011

Federal University Team Honored for Developing Nanotube Technology to Disperse Oil from Water

Capping a week’s worth of startup development efforts and cultural exchanges, the Council on Competitiveness, the Brazilian Agency for Industrial Development, and other distinguished guests from Brazil and the United States came to ASU SkySong on Friday for an “Innovation Learning Lab” focused on building bilateral partnerships between those countries to foster innovation and entrepreneurship.

From Arizona State University 9 Feb 2011

Single-Molecule Imaging Method to Inspect Receptors in Living Cell Membranes

Unprecedented single molecule imaging movies of living cell membranes, taken by a research team based at Kyoto University and the University of New Mexico, have clarified a decades-old enigma surrounding receptor molecul...

8 Feb 2011

picoSpin-45 NMR Spectrometer to Receive 2011 Edison Best New Product Award

picoSpin, LLC has been named as an Award finalist by the internationally-known 2011 Edison Best New Product Awards™.

8 Feb 2011

Synopsys Announces Availability of Platform Architect with Multicore Optimization Technology

Synopsys, Inc. a world leader in software and IP for semiconductor design, verification and manufacturing, today announced the broad availability of Platform Architect with Multicore Optimization Technology, a new solution for performance analysis and early definition of multicore system architectures in SystemC.

From Synopsys, Inc. 8 Feb 2011

Rudolph Receives Multiple Orders for Latest Opaque Thin Film Metrology Tool

Rudolph Technologies, Inc. a leading provider of process characterization equipment and software for wafer fabs and advanced packaging facilities, announced today that it has received multiple system orders from a major Asian foundry and an IDM (integrated device manufacturer) with fabrication facilities in the U.S. for its latest MetaPULSE®-G opaque metrology tool.

From Onto Innovation 8 Feb 2011