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Leica Microsystems Introduces New Digital Microscope for Quality Analysis and Inspection

When the demands of quality inspection reach the limits of optical microscopes, digital technology provides QA professionals with the power to take visual analysis to the next level.

From Leica Microsystems GmbH 13 Sep 2010

University of Cambridge Installs New Powerful Microscope for Nanotechnology Research

The most powerful atom resolving microscope in the UK was today revealed at the University of Cambridge. The new electron microscope, which will enable scientists to view individual atoms in any material, was officially unveiled by the Minister for Universities and Science, the Rt Hon David Willetts MP.

10 Sep 2010

Results Now Available for the First American-European Study on AFMs and SPMs

Atomic Force Microscopy is the tool of choice for nanotechnology and many materials analyses. Representing an estimated $220M/year industry, only anecdotal information has been available for this critical market. The Mic...

8 Sep 2010

Coriolis Pharmaservices Uses Nanosight to Investigate Aggregation Behaviour of Protein Drugs and Vaccines

Munich-based company Coriolis PharmaServices GmbH is using NanoSight’s LM-20 nanoparticle characterization system to investigate the aggregation behaviour of protein drugs and vaccines.

7 Sep 2010

JPK Instrument Introduces New Standard In SPM Control Systems

JPK Instruments, a world-leading manufacturer of nanoanalytic instrumentation in life sciences and soft matter announces the Vortis™ Advanced, the new standard in SPM Control systems with the lowest noise and highest signal speeds seen to date.

From Bruker BioAFM 7 Sep 2010

Why GPS-SEC is the Only Light Scattering Technique for Molecular Weight Determination

A newly available application note from Malvern Panalytical explains why, when measuring samples using Gel Permeation Chromatography/Size Exclusion Chromatography (GPC/SEC), low angle light scattering (LALS) is the only LS technique that actually measures a scattered light intensity directly proportional to molecular weight.

From Malvern Panalytical 7 Sep 2010

Nanolane Launch SARFUS-3D for Characterizing Nanometric Samples in Water

Nanolane is proud to announce the launch of its new equipment SARFUS 3D-IMM dedicated to the topographic characterization of nanometric samples in water.

From NANOLANE 6 Sep 2010

Malvern's Zetasizer Nano Helps Secure 5th Queens Award

Sir Michael Brinton, the Lord Lieutenant* of Worcestershire, today formally presented the 2010 Queen’s Award for Enterprise in Innovation to materials characterization company Malvern Panalytical in a ceremony held at its UK headquarters.

From Malvern Panalytical 5 Sep 2010

New Microscope Features Ultra Stable Specimen Stage For High Magnification Navigation

The new SU8040 Field Emission Scanning Electron Microscope (FE-SEM) from Hitachi High-Technologies features a newly developed Regulus (REGULated Ultra Stable) Specimen Stage for unprecedented smooth sample control even at ultra-high magnification.

31 Aug 2010

Measuring Nanoscale Structures Using Tiny Rulers

With the advent of nanometer-sized machines, there is considerable demand for stable, precise tools to measure absolute distances and distance changes. One way to do this is with a plasmon ruler. In physics jargon, a "plasmon" is the quasiparticle resulting from the quantization of plasma oscillation; it's essentially the collective oscillations of the free electron gas at a metallic surface, often at optical frequencies.

31 Aug 2010