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First Probe Stations Installed to be Used to Promote Global Research and Science Achievement

Cascade Microtech, Inc. (NASDAQ: CSCD) today announced King Abdullah University of Science and Technology's selection of multiple probe stations to support measurements in the area of materials analysis, nano-technol...

25 Sep 2009

Jordan Valley Semiconductors Announces Delivery of JVX6200 XRR Metrology Tool to HDD Vendor

Jordan Valley Semiconductors Ltd., the market leader in X-ray metrology tools is pleased to announce the delivery of its JVX6200 XRR (X-Ray Reflectometry) metrology tool to a leading-edge HDD (Hard Disk Drive) vendor, us...

24 Sep 2009

DEK Launches New Paste Roll Height Monitor

DEK has launched its brand new Paste Roll Height Monitor, an easy-to-use productivity tool designed to eliminate defects and improve end-of-line yield. Using lasers to detect the presence of solder paste, the new technol...

22 Sep 2009

NIST Issues New Nano-Ruler

The National Institute of Standards and Technology (NIST) has issued a new ruler, and even for an organization that routinely deals in superlatives, it sets some records. Designed to be the most accurate commercially ava...

22 Sep 2009

Solar Metrology Expands its SMX XRF Tool Portfolio

Solar Metrology, a global provider of X-Ray Fluorescence (XRF) analysis tools, expands its SMX XRF tool portfolio for film composition and thickness measurement of CIGS photovoltaic depositions with the addition of the S...

21 Sep 2009

Rapid, Three-Dimensional Surface Characterization for Large Samples

Veeco Instruments Inc. (Nasdaq: VECO), a leader in scientific and industrial metrology, today announced the release of its NPFLEX™ 3D Metrology System for characterizing surfaces previously too difficult to measure due to size or part orientation.

From Veeco 21 Sep 2009

New Microscope Could Revolutionize Nanoscale Imaging

Scientists at the U.S. Department of Energy's (DOE) Brookhaven National Laboratory, in collaboration with researchers from Hitachi High Technologies Corp., have demonstrated a new scanning electron microscope capable of selectively imaging single atoms on the top surface of a specimen while a second, simultaneous imaging signal shows atoms throughout the sample's depth.

From Brookhaven National Laboratory 20 Sep 2009

Retired Computational Pioneer Wins National Medal of Science

Retired Lawrence Livermore National Laboratory lab physicist and computational pioneer Berni Alder has received the National Medal of Science.

From Lawrence Livermore National Laboratory 17 Sep 2009

There's a New Way to Explore Biology's Secrets

There's a new way to explore biology's secrets. With a flash of light, scientists from the U.S. Department of Energy's Lawrence Berkeley National Laboratory and the University of California, Berkeley zeroed in on the type of neural cell that controls swimming in larval zebrafish.

From Lawrence Berkeley National Laboratory 16 Sep 2009

Carl Zeiss Introduces ACCTeePro Integrated Software for Surface Finish, Form and Geometry

Carl Zeiss IMT will be introducing the next generation of TiMS software, the ACCTeePro integrated software for surface finish, form and geometry, at the 2009 Quality Expo held in Chicago on September 22 -24th.

From Carl Zeiss Microscopy GmbH 16 Sep 2009