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Studying the Roughness of Surfaces Can Reveal Wealth of Useful Information

Pathways into the Scientific World of Nanotechnology

Pathways into the Scientific World of Nanotechnology

New Center Enables Reliable Delivery of Wafer-Level Packaging and Wafer-Level Optics to Customers

SEMATECH Will Perform Innovative 3D Applications at CNSE's Albany NanoTech with SET's High Accuracy FC300 System

Scientists Achieve High Precision Optical Broadband Spectroscopy by Applying Frequency Comb Technique to Tunable Diode Lasers

Scientists Achieve High Precision Optical Broadband Spectroscopy by Applying Frequency Comb Technique to Tunable Diode Lasers

Researchers Measure Coherent X-Ray Diffraction Patterns of Collagen in Soft Tissues

Researchers Measure Coherent X-Ray Diffraction Patterns of Collagen in Soft Tissues

SUSS MicroTec Introduces Probe Station PA300PS 3D

SUSS MicroTec Introduces Probe Station PA300PS 3D

Carl Zeiss Presents Integrated Solution for Correlative Microscopy in Materials Analysis

Carl Zeiss Presents Integrated Solution for Correlative Microscopy in Materials Analysis

Scientists Image "Anatomy" of a Molecule using Noncontact Atomic Force Microscopy

Scientists Image "Anatomy" of a Molecule using Noncontact Atomic Force Microscopy

PI Extends E-616 Multi-Channel Controller Line for Piezo Based Steering and Stabilization Mirror Platforms

PI Extends E-616 Multi-Channel Controller Line for Piezo Based Steering and Stabilization Mirror Platforms

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