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Palm MicroTweezer Module Enables Manipulation of Microscopic Particles and Quantitative Measurement of Forces

Palm MicroTweezer Module Enables Manipulation of Microscopic Particles and Quantitative Measurement of Forces

Malvern to Host Webminar on Rheological Characterization of Polymer Nanocomposites

Malvern to Host Webminar on Rheological Characterization of Polymer Nanocomposites

Applied SEMVision G4 Defect Analysis Platform Honored with Prestigious Editors' Choice Best Product Award By SI Magazine

Applied SEMVision G4 Defect Analysis Platform Honored with Prestigious Editors' Choice Best Product Award By SI Magazine

Brookhaven National Lab Scientists Named Recipients of Presidential Early Career Award for Scientists and Engineers

Brookhaven National Lab Scientists Named Recipients of Presidential Early Career Award for Scientists and Engineers

Nanometrics Announces Delivery of Unifire Metrology System

Nanometrics Announces Delivery of Unifire Metrology System

Rudolph Technologies Announces the Availability of its New S3000S Metrology System

'Bullet Fingerprinting' Being Advanced in New Ways

'Bullet Fingerprinting' Being Advanced in New Ways

Veeco Joins Microsystems Industrial Group

Veeco Joins Microsystems Industrial Group

System Enables SEMATECH To Verify Alignment Of Bonded Wafers And Through Silicon Vias

System Enables SEMATECH To Verify Alignment Of Bonded Wafers And Through Silicon Vias

Attachments Allow Use of LED-Based Microscope for Fluorescence Applications

Attachments Allow Use of LED-Based Microscope for Fluorescence Applications

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