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Nanometrics Receives Orders for VerteXTM and Multiple RPMBlueTM PL Mapping Metrology Systems

8 Jul 2009
Variable Pressure Mode Extends Analytical Capabilities

Variable Pressure Mode Extends Analytical Capabilities

From Carl Zeiss Microscopy GmbH 8 Jul 2009
CRAIC Technologies Introduces QDI 2010 Film Microspectrophotometer Designed to Measure Thickness of Thin Films PV Cells

CRAIC Technologies Introduces QDI 2010 Film Microspectrophotometer Designed to Measure Thickness of Thin Films PV Cells

7 Jul 2009
JPK Instruments Announces the Opening of Their First Offices in Japan

JPK Instruments Announces the Opening of Their First Offices in Japan

From Bruker BioAFM 7 Jul 2009
Physicists Succeeded in Demonstrating the Electronic Structure of an Interface in a Solid for the First Time

Physicists Succeeded in Demonstrating the Electronic Structure of an Interface in a Solid for the First Time

6 Jul 2009
Work Could Lead to Technologies for Health Care Like Better Diagnostics and Deeper Understanding of Cancer

Work Could Lead to Technologies for Health Care Like Better Diagnostics and Deeper Understanding of Cancer

6 Jul 2009
Nano Coordinate Measuring Instrument for Three-Dimensional Objects

Nano Coordinate Measuring Instrument for Three-Dimensional Objects

6 Jul 2009
Hitachi Introduces New Techniques in SEM, STEM, TEM and FIB

Hitachi Introduces New Techniques in SEM, STEM, TEM and FIB

6 Jul 2009
Researchers Examine 15th-Century Paintings Using Grenoble Synchrotron

Researchers Examine 15th-Century Paintings Using Grenoble Synchrotron

2 Jul 2009

Zecotek Photonics Selected by Russian Academy of Sciences for New Research Areas

From Zecotek Photonics 2 Jul 2009

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