Atomic Force Microscopes News

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Raith Launches New FIB-SEM for FIB-Centric Nanofabrication

Raith Launches New FIB-SEM for FIB-Centric Nanofabrication

Even New AFM Tips are Not as Clean as You Think!

Even New AFM Tips are Not as Clean as You Think!

Park Systems Announces the Grand Opening of the Park NanoScience Center at SUNY Polytechnic Institute

Catholic University of Rome Uses the JPK NanoWizard® AFM & CellHesion® Systems to Understand How Cells Sense and Respond to Mechanical Stimuli

Conference-Review: 13th Confocal Raman Imaging Symposium

Bruker Introduces Complete Commercial AFM-Based SECM Solution

Bruker Introduces Complete Commercial AFM-Based SECM Solution

Park Systems, World Leading Manufacturer of Atomic Force Microscopes Receives Frost & Sullivan 2016 Global Enabling Technology Leadership Award

FEI and Cornell University Collaborate to Commercialize New EMPAD Detector

FEI and Cornell University Collaborate to Commercialize New EMPAD Detector

Atomic Force Microscopy Takes Snapshots of Two Molecules Reacting on Surface of Catalyst

Atomic Force Microscopy Takes Snapshots of Two Molecules Reacting on Surface of Catalyst

Researchers Directly Visualize Nuclear Pore’s Selective Barrier and Dynamic Behavior Using High-Speed AFM

Researchers Directly Visualize Nuclear Pore’s Selective Barrier and Dynamic Behavior Using High-Speed AFM

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