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Next Generation Lithography Technologies For The Production of Advanced Semiconductors

Plastic Logic Buy Thin Film Deposition Tool from AIXTRON

Nanometrics Divest Properties

Half Billion Dollar Microsystems Engineering Sciences Complex Completed at Sandia

Micralyne Named 2007 MEMS Foundry of the Year

Nanobattery Smart Enough To Pass Army Tests

Palm-Top-Sized Precision Translation Stage with Ballscrew Drive & Optical Linear Encoder

Photovoltaic Company Chooses Manufacturing Software To Reduce Time To Market of New Solar Cell Technologies

UVISEL VUV Phase Modulated Spectroscopic Ellipsometer From HORIBA Scientific Extended Down To 140nm

UVISEL VUV Phase Modulated Spectroscopic Ellipsometer From HORIBA Scientific Extended Down To 140nm

High Accuracy Measurement of Film Thickness, Refractive Index and Reflectivity of Thin Films and Multilayer Stacks From HORIBA Scientific

High Accuracy Measurement of Film Thickness, Refractive Index and Reflectivity of Thin Films and Multilayer Stacks From HORIBA Scientific

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