Jul 3 2010
McBain Systems of Simi Valley announced that it will be exhibiting at the Semicon West show in San Francisco later this month. McBain will show its recently introduced near-infrared (NIR) defect detection and review (DDR) stations as well as its automated wafer handling systems.
Automated wafer handling systems
McBain's DDR300 NIR system, which is able to "see" through silicon and other materials, was recently installed in a major semiconductor fab in Kulim, Malaysia, to check for subsurface cracks and other defects in flip-chip devices. The DDR300 NIR operates in the spectral range between 900nm and 1700nm and is touted as having the highest resolution of any instrument in its class. The system is available in two models, for inspecting 200mm and 300mm wafers.
Also on display will be McBain's unique wafer loading systems. These units provide streamlined, semiautomated loading of wafers and may be used with a range of optical inspection systems. These compact, economically priced systems are easily integrated and provide throughputs of over 750 wafers per hour. McBain offers two models to handle a range of wafer sizes, from 3-inch to 8-inch.
The Semicon West show will be held at the Moscone Center in San Francisco, July 13-15. McBain Systems will be exhibiting at booth 1343 in the South Hall.
Source: http://www.mcbainsystems.com/